2010
DOI: 10.1117/12.870257
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Tilt scanning interferometry: a 3D k-space representation for depth-resolved structure and displacement measurement in scattering materials

Abstract: Tilt Scanning Interferometry (TSI) has been recently developed as an experimental method to measure multi-component displacement fields inside the volume of semitransparent scattering materials. It can be considered as an extension of speckle interferometry in 3D, in which the illumination angle is tilted to provide depth information, or as an optical diffraction tomography technique with phase detection. It relies on phase measurements to extract the displacement information, as in the usual 2D counterparts. … Show more

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