“…This difference can be attributed to the localized heating effects of the electron beam of the SEM and sample preparation. The electron-beam intensity of the SEM is much higher than that of the RHEED beam, thus localized heating due to this beam is significant, being as high as 40 K. 2 Spiller estimates the temperature rise to be 0.5 K on account of the high thermal conductivity of the substrate, neglecting the interface mismatch between the substrate and the film, the presence of domain boundaries, and defects in thin-film layers that may contribute to a decrease in the thermal conductivity. Thus, there may be a difference between the measured and the real values, and that this could explain the discrepancy between our results and those obtained previously.…”