Time-domain photocurrent spectroscopy based on a common-path birefringent interferometer

Wolz, Lukas; Heshmatpour, Constantin; Perri, Antonio; Polli, Dario; Cerullo, Giulio; Finley, Jonathan J.; Thyrhaug, Erling; Hauer, Jürgen; Stier, Andreas V.

doi:10.1063/5.0023543

Cited by 5 publications

(1 citation statement)

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“…Following the same principle, a slightly modified version called TWINS comprising two additional birefringent crystals was used in ultrafast twodimensional spectroscopy [8,9]. It was recently employed as the key element in a photocurrent microscope [10] and quantum optics [11]. This manuscript focuses on several different applications, especially in the visible and near-infrared spectral region, where it is usually hard to apply FT-spectroscopy.…”

Section: Introductionmentioning

confidence: 99%

Visible and near-infrared Fourier transform spectroscopy with a common-path interferometer

Perri¹

2021

J. Phys. B: At. Mol. Opt. Phys.

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Optical spectrometers can be generally divided into two categories, frequency-domain and time-domain ones. The former includes compact, industrial-grade instruments that are easily available in the visible spectral range. The latter are lab-grade, bulky and fragile instruments that offer very high sensitivity and accuracy but are mainly limited to the infrared spectral region. This manuscript aims to present a time-domain device and several of its applications in which it is possible to combine some of the advantages of the two techniques, finally, bringing the advantage of Fourier transform spectroscopy down to the visible and near-infrared spectral regions. The device is a common-path interferometer based on birefringence. The concept is straightforward, and it is a compact, robust, and cost-effective instrument, and it has been applied in a wide range of applications. In this manuscript, the interferometer will be described from a theoretical point of view, and its capabilities will be presented applied to the measurement of fluorescence excitation-emission matrix maps down to the ultimate sensitivity at the single-molecule level, time-resolved photoluminescence spectra, spectral images, and the complex optical activity.

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Section: Introductionmentioning

confidence: 99%

Visible and near-infrared Fourier transform spectroscopy with a common-path interferometer

Perri¹

2021

J. Phys. B: At. Mol. Opt. Phys.

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Atomically Flat Dielectric Patterns for Bandgap Engineering and Lateral Junction Formation in MoSe₂ Monolayers

Moser,

Wolz,

Henning

et al. 2024

Adv Funct Materials

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Combining a precise sputter etching method with subsequent AlOx growth within an atomic layer deposition chamber enables the fabrication of atomically flat lateral patterns of SiO2 and AlOx. The transfer of MoSe2 monolayers onto these dielectrically modulated substrates results in the formation of lateral heterojunctions due to the interaction with alternating regions of SiO2 and AlOx, with the flat substrate topography leading to minimal strain across the junction. Kelvin probe force microscopy measurements show significant variations in the contact potential difference (CPD) across the interface, with AlOx regions inducing a 230 mV increase in CPD. Photoluminescence spectroscopy reveals shifts in spectral weight of neutral and charged exciton species across the different dielectric regions. On the AlOx side, the Fermi energy moves closer to the conduction band, leading to a higher trion‐to‐exciton ratio, indicating a bandgap shift consistent with CPD changes. In addition, transient reflection spectroscopy highlights the influence of the dielectric environment on carrier dynamics, with the SiO2 side exhibiting rapid carrier decay typical of neutral exciton recombination. In contrast, the AlOx side shows slower, mixed decay behavior consistent with conversion of trions back into excitons. These results demonstrate how dielectric substrate engineering can tune 2D materials, allowing scalable fabrication of advanced junctions for novel (opto)electronics applications.

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Raman spectroscopy by a detector-noise-limited birefringent wedge-based Fourier transform spectrometer

Lyu,

Wang,

Neogi

2024

Optics and Lasers in Engineering

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Time-domain photocurrent spectroscopy based on a common-path birefringent interferometer

Cited by 5 publications

References 24 publications

Visible and near-infrared Fourier transform spectroscopy with a common-path interferometer

Visible and near-infrared Fourier transform spectroscopy with a common-path interferometer

Atomically Flat Dielectric Patterns for Bandgap Engineering and Lateral Junction Formation in MoSe₂ Monolayers

Raman spectroscopy by a detector-noise-limited birefringent wedge-based Fourier transform spectrometer

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Time-domain photocurrent spectroscopy based on a common-path birefringent interferometer

Cited by 5 publications

References 24 publications

Visible and near-infrared Fourier transform spectroscopy with a common-path interferometer

Visible and near-infrared Fourier transform spectroscopy with a common-path interferometer

Atomically Flat Dielectric Patterns for Bandgap Engineering and Lateral Junction Formation in MoSe2 Monolayers

Raman spectroscopy by a detector-noise-limited birefringent wedge-based Fourier transform spectrometer

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Product

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Atomically Flat Dielectric Patterns for Bandgap Engineering and Lateral Junction Formation in MoSe₂ Monolayers