Time of Flight measurements in PET systems using FPGAs

Abstract

This contribution shows how to perform Time of Flight (TOF) measurements in Positron Emission Tomograph y (PET) s y stems using low-cost Field-Programmable Gate Arra y (FPGA) device with a resolution better than 100 ps. This is achieved with a proper management of the FPGA internal resources and with an extremel y careful device calibration process including both temperature and voltage compensation. The results of s y stem calibration and different time measurements between multiple channels are presented.