Time‐of‐Flight secondary ion mass spectrometry (TOF‐SIMS) using the metal‐cluster‐complex primary ion of Ir4(CO)7+

Fujiwara, Yukio; Saito, Naoaki; Nonaka, Hidehiko; Suzuki, Atsushi; Nakanaga, Taisuke; Fujimoto, Toshiyuki; Kurokawa, Akira; Ichimura, Shingo

doi:10.1002/sia.3435

Cited by 5 publications

(6 citation statements)

References 23 publications

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“…The system used in the first TOF‐SIMS experiment was an orthogonal acceleration TOF‐SIMS system equipped with a metal‐cluster‐complex ion source. A detailed description of the system has been reported previously . Briefly, it consists of the metal‐cluster‐complex ion source, a sample plate, electrostatic lenses for transporting secondary ions, and an orthogonal acceleration time‐of‐flight (TOF) mass spectrometer.…”

Section: Methodsmentioning

confidence: 99%

“…A detailed description of the system has been reported previously. [49] Briefly, it consists of the metal-cluster-complex ion source, a sample plate, electrostatic lenses for transporting secondary ions, and an orthogonal acceleration time-of-flight (TOF) mass spectrometer. The metal-cluster-complex ion source is capable of producing a continuous primary ion beam of either Ir 4 (CO) 7 + or Ar + .…”

Section: Tof-sims Using An Ar + Primary Ion Beammentioning

confidence: 99%

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Effects of a proton‐conducting ionic liquid on secondary ion formation in time‐of‐flight secondary ion mass spectrometry

Fujiwara

Saito

2015

Rapid Comm Mass Spectrometry

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Section: Methodsmentioning

confidence: 99%

Section: Tof-sims Using An Ar + Primary Ion Beammentioning

confidence: 99%

Effects of a proton‐conducting ionic liquid on secondary ion formation in time‐of‐flight secondary ion mass spectrometry

Fujiwara

Saito

2015

Rapid Comm Mass Spectrometry

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“…312 Numerous aspects were discussed, including the increased secondary ion yields, the raised sputtering threshold energies, damage effects and depth-profiling capabilities. 314 The sample was bombarded with Ir 4 (CO) 7 at an incident angle of 45 and with an energy of 10 keV. This example demonstrated the necessity of using cluster ions for analysing the weaker, high mass peaks.…”

Section: X-ray Based Techniquesmentioning

confidence: 97%

“…Another example has been reported by Fujiwara and colleagues, who used iridium carbonyl metalcluster complexes such as Ir 4 (CO) 12 and Ir 4 (CO) 7 that have molecular weight of greater than or close to 1000 to analyse a contaminated silicon substrate and the room temperature molten salt N,N-diethyl-N-methyl-N-(2-methoxyethyl)ammonium bis(trifluoromethanesulfonyl)imide. 314 The sample was bombarded with Ir 4 (CO) 7 at an incident angle of 45 and with an energy of 10 keV. Results were compared with those obtained using a standard Ar + primary ion beam.…”

Section: Sims and Tof-sims Applicationsmentioning

confidence: 99%

Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials

Carter

Fisher

Goodall

et al. 2011

J. Anal. At. Spectrom.

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Metals 1.1 Ferrous metals and alloys 1.2 Non-ferrous metals and alloys 2 Chemicals 2.1 Petroleum and petroleum products 2.1.1 Petroleum products -gasoline, diesels, gasohol, exhaust particulates 2.1.2 Fuel -coal, fly ash, particulates/emissions 2.1.3 Oils -crude oil, lubricants 2.1.4 Alternative fuels 2.2 Organic chemicals and solvents 2.2.1 The analysis of archaeological and art objects 2.2.2 LIBS and other laser techniques 2.2.3 Mass spectrometric techniques 2.2.4 Ion beam techniques 2.2.5 Speciation 2.2.6 Extraction, preconcentration and sample introduction 2.3 Inorganic chemicals and acids 2.3.1 Reviews, overviews and CRMs 2.3.2 Cements, concretes and plasters 2.3.3 Matrix modifiers 2.3.4 Forensic applications 2.3.5 Other applications 2.3.6 The analysis of nano-structures 2.3.6.1 Reviews and CRMs 2.3.6.2 Methods of analysis 2.4 Nuclear materials 2.4.1 Reviews and overviews 2.4.2 Nuclear forensic and safeguards applications 2.4.3 Other nuclear applications 3 Advanced materials 3.1 Polymeric materials and composites

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“…The experiment was performed using an orthogonal acceleration TOF-SIMS system equipped with a metal-cluster-complex ion source. 22) Details of the SIMS system have been reported previously. 22) The ion source was capable of producing a continuous primary ion beam of either Ir 4 (CO) 7 + or Ar + .…”

mentioning

confidence: 99%

Increasing the intensity of protonated secondary ions in time-of-flight secondary ion mass spectrometry using a proton-conducting ionic liquid, diethylmethylammonium trifluoromethanesulfonate

Fujiwara

Saito

2015

Appl. Phys. Express

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To increase the secondary ion intensities of organic molecules, room-temperature ionic liquids were investigated in two time-of-flight secondary ion mass spectrometry (TOF-SIMS) experiments. First, ionic liquids as well as glycerol were tested as liquid matrices of arginine. The secondary ion intensity of protonated arginine was increased 200-fold by using a proton-conducting ionic liquid, diethylmethylammonium trifluoromethanesulfonate ([dema][TfO]). The matrix effect of [dema][TfO] was higher than that of glycerol, which is a typical matrix in SIMS. Next, ionic liquids were tested as primary ion beams. The number of protonated secondary ions of arginine was significantly increased by using a primary ion beam of [dema][TfO].

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Time‐of‐Flight secondary ion mass spectrometry (TOF‐SIMS) using the metal‐cluster‐complex primary ion of Ir₄(CO)₇⁺

Cited by 5 publications

References 23 publications

Effects of a proton‐conducting ionic liquid on secondary ion formation in time‐of‐flight secondary ion mass spectrometry

Effects of a proton‐conducting ionic liquid on secondary ion formation in time‐of‐flight secondary ion mass spectrometry

Atomic spectrometry update. Industrial analysis: metals, chemicals and advanced materials

Increasing the intensity of protonated secondary ions in time-of-flight secondary ion mass spectrometry using a proton-conducting ionic liquid, diethylmethylammonium trifluoromethanesulfonate

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