Time-resolved frequency chirp measurement using a silicon-wafer etalon

Tammela, Simo; Ludvigsen, Hanne; Kajava, T.; Kaivola, Matti

doi:10.1109/68.559393

Cited by 25 publications

(15 citation statements)

References 10 publications

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“…In fact, our technique is similar to the discriminator technique proposed in refs [9][10][11][12], which are also based on the measurement of the temporal intensities after filtering the signal with different transfer functions. The main advantage of the PROUD method in comparison with these techniques is that the expression providing the frequency chirp takes into account not only the amplitude of the frequency response of the filter, but also its phase response, which gives rise to the term d|u(t)|/dt in Eq.…”

Section: Resultsmentioning

confidence: 99%

“…In comparison with other techniques for the characterization of TRC [9][10][11][12][13][14], our procedure is very simple avoiding time consuming sensitive adjustments. In fact, our technique is similar to the discriminator technique proposed in refs [9][10][11][12], which are also based on the measurement of the temporal intensities after filtering the signal with different transfer functions.…”

Section: Resultsmentioning

confidence: 99%

“…They are based on frequency discriminators [9][10][11][12], Brillouin scattering interaction [13] and spectral phase measurements [14]. Recently, Li et al [15,16] have proposed a different approach named "phase reconstruction by optical ultrafast differentiation" (PROUD).…”

Section: Introductionmentioning

confidence: 99%

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Time resolved chirp measurements of gain switched semiconductor laser using a polarization based optical differentiator

Consoli¹,

Tijero²,

Esquivias³

2011

Opt. Express

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Abstract:We present a novel implementation of the "phase reconstruction using optical ultra fast differentiation" (PROUD) technique and apply it to characterize the time resolved chirp of a gain switched semiconductor laser. The optical temporal differentiator is a fiber based polarization interferometer. The method provides a fast and simple recovery of the instantaneous frequency from two temporal intensity measurements, obtained by changing the spectral response of the interferometer. Pulses with different shapes and durations of hundreds of picoseconds are fully characterized in amplitude and phase. The technique is validated by comparing the measured pulse spectra with the reconstructed spectra obtained from the intensity and the recovered phase. 792-794 (1998). 5. C. Dorrer and I. Kang, "Highly sensitive direct characterization of femtosecond pulses by electro-optic spectral shearing interferometry," Opt. Lett. 28(6), 477-479 (2003). 6. C. Dorrer and I. Kang, "Simultaneous temporal characterization of telecommunication optical pulses and modulators by use of spectrograms," Opt. Lett. 27(15), 1315-1317 (2002). 7. J. R. Fienup, "Phase retrieval algorithms: a comparison," Appl. Opt. 21(15), 2758-2769 (1982). 8. R. W. Gerchberg and W. O. Saxton, "A practical algorithm for the determination of the phase from image and diffraction plane pictures," Optik (Stuttg.) 35, 237-246 (1972). 9. N. S. Bergano, "Wavelength discriminator method for measuring dynamic chirp in DFB lasers," Electron. Lett. 1296-1297 (1988). 10. C. Laverdiere, A. Fekecs, and M. Tetu, "A new method for measuring time-resolved frequency chirp of high bit rate sources," IEEE Photon. Technol. Lett. 15(3), 446-448 (2003). 11. K. Sato, S. Kuwahara, and Y. Miyamoto, "Chirp characteristics of 40-Gb/s directly modulated distributedfeedback laser diodes," J. Lightwave Technol. 23(11), 3790-3797 (2005). 12. S. Tammela, H. Ludvigsen, T. Kajava, and M. Kaivola, "Time-resolved frequency chirp measurement using a silicon-wafer etalon," IEEE Photon. Technol. Lett. 9(4), 475-477 (1997 19872-19881 (2008) ©2011 Optical Society of America 24(20),

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Section: Resultsmentioning

confidence: 99%

Section: Resultsmentioning

confidence: 99%

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Time resolved chirp measurements of gain switched semiconductor laser using a polarization based optical differentiator

Consoli¹,

Tijero²,

Esquivias³

2011

Opt. Express

View full text Add to dashboard Cite

show abstract

“…In fact, this method is more frequently used for electro-optical modulators, where the time-resolved chirp is a little simpler than that of LD, because there is only a transient term (Jeong & Park, 1997). Time-resolved frequency chirp measurements reveal more detailed information about LDs optical beam frequency behaviour by comparing with ordinary averaged optical beam spectrum measurements, because the time-resolved representation of frequency deviations shows specific chirp details, such as frequency oscillations and the amplitude of these oscillations (Welford, 1985;Olsen & Lin, 1989;Tammela et al, 1997).…”

Section: Large Signal: Optical Power Modulation and Chirpmentioning

confidence: 99%

Investigation of High-Speed Transient Processes and Parameter Extraction of InGaAsP Laser Diodes

Vyšniauskas¹,

Vasiliauskas²,

Šermukšnis³

et al. 2012

Semiconductor Laser Diode Technology and Applications

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“…The employed chirp measurement method is based on a Fabry-Pérot interferometer, as a frequency discriminator [28].…”

Section: Chirp Due To Wavelength Conversion In An Soa-mzimentioning

confidence: 99%

On intranode impairments and engineering rules for an optical label switching router supporting an FSK/IM labeling scheme

Olmos

Monroy

Berkel

et al. 2006

J. Lightwave Technol.

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Time-resolved frequency chirp measurement using a silicon-wafer etalon

Cited by 25 publications

References 10 publications

Time resolved chirp measurements of gain switched semiconductor laser using a polarization based optical differentiator

Time resolved chirp measurements of gain switched semiconductor laser using a polarization based optical differentiator

Investigation of High-Speed Transient Processes and Parameter Extraction of InGaAsP Laser Diodes

On intranode impairments and engineering rules for an optical label switching router supporting an FSK/IM labeling scheme

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