2008
DOI: 10.1063/1.2842423
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Time resolved magneto-optical studies of ferromagnetic InMnSb films

Abstract: .; Kini, R. N.; Nontapot, K.; et al., "Time resolved magnetooptical studies of ferromagnetic InMnSb films," Appl. Phys. Lett. 92, 061911 (2008); http://dx

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Cited by 7 publications
(6 citation statements)
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“…The initial sharp decrease in the differential reflectivity can result from free carrier Drude absorption whereas; the alteration of the dielectric function of the film through changes in the electron and hole distribution functions, can be responsible for the observed sign change of the differential reflectivity. A similar fast carrier dynamics and the sign change in the transient reflectivity have been reported in MBE grown InMnAs and InAs films [14][15][16][17]20] . The possibility of increasing the relaxation time of the photo-excited carriers by injection carrier above the gap into the satellite valley can be important in developing devices on the basis of these ferromagnetic materials.…”
Section: Carrier Dynamics In Inmnas and Inmnsbsupporting
confidence: 53%
See 1 more Smart Citation
“…The initial sharp decrease in the differential reflectivity can result from free carrier Drude absorption whereas; the alteration of the dielectric function of the film through changes in the electron and hole distribution functions, can be responsible for the observed sign change of the differential reflectivity. A similar fast carrier dynamics and the sign change in the transient reflectivity have been reported in MBE grown InMnAs and InAs films [14][15][16][17]20] . The possibility of increasing the relaxation time of the photo-excited carriers by injection carrier above the gap into the satellite valley can be important in developing devices on the basis of these ferromagnetic materials.…”
Section: Carrier Dynamics In Inmnas and Inmnsbsupporting
confidence: 53%
“…Most of the understanding of the carrier relaxation in narrow gap (III,Mn)V ferromagnetic structures has been on the basis of two color differential reflectivity spectroscopy [14][15][16][17] where the rapid change of the differential reflectivity was ascribed to a fast disappearance of photo-induced free carriers through ultrafast trapping by mid-gap states. Similar fast relaxation in the differential reflectivity patterns of relaxation dynamic are commonly seen in low-temperature-grown III-V semiconductors [18] .…”
Section: Carrier Dynamics In Inmnas and Inmnsbmentioning
confidence: 99%
“…[10][11][12][13] In the reported measurements, rapid change of the differential reflectivity was observed and ascribed to a fast disappearance of photoinduced free carriers through ultrafast trapping by midgap states. The carrier relaxation time reported in the MBE grown InMnAs 12 demonstrated a similar time scale as an InAs film under similar experimental conditions.…”
Section: Narrow Gap Ferromagnetic Semiconductors (Ngfs) Such Asmentioning
confidence: 91%
“…Most of the understanding of the spin relaxation in narrow gap (III,Mn)V ferromagnetic structures has been on the basis of two color magneto-optical Kerr (MOKE) time-domain spectroscopy [21][22][23][24] . In multi-layer structures, the signal in general, is a mixture of "absorptive" (resonant) and "dispersive" contributions.…”
Section: Time Resolved Measurements Of Inmnasmentioning
confidence: 99%