Influence of surface tension on cavitation noise spectra and particle removal efficiency in high frequency ultrasound fields,
Journal of Applied Physics, 112(11).
Archived versionFinal publisher's version / pdf Influence of surface tension on cavitation noise spectra and particle removal efficiency in high frequency ultrasound fields Physical cleaning methods are applied in the semiconductor industry and have become increasingly challenging due to the continued scaling of semiconductors device elements. Cavitation and acoustic phenomena are known to play a fundamental role in megasonic cleaning. Hence, a better understanding of cavitation phenomena in multi-bubble systems is crucial. Here, a study on the effects of lower bulk surface tension and different O 2 concentrations on the bubble activity in the megahertz range is presented. A lower bulk surface tension (45 mN/m) with respect to ultra pure water (72 mN/m) is obtained by adding a non-ionic surface-active agent (Triton X-100). After a thorough surfactant characterization, a Triton X-100-containing cleaning solution is investigated under pulsed and continuous acoustic fields, for different acoustic amplitudes and gas concentrations. It is demonstrated that cavitation activity, measured by means of ultraharmonic cavitation noise, is enhanced in presence of a lower surface tension, under continuous acoustic fields. In addition, cavitation measurements performed under pulsed fields reveal the existence of optimal pulse-off times, for which a maximum of activity is observed. These optimal pulse-off time values are linked to the bubble dissolution theoretical times and experimentally verified. To end, cavitation noise measurements are correlated to cleaning performance in megasonic fields by means of particle removal and damage tests on patterned wafers. A clear increase in particle removal efficiency of 78 nm SiO 2 particles is obtained when Triton X-100 is employed, at the optimized process conditions. In addition, the number of defects due to cavitation bubbles is significantly reduced for lower surface tension, at particle removal efficiencies <60%. The results here reported constitute a different approach towards more efficient megasonic cleaning processes.