Time resolved near-field scanning optical microscopy

Abstract

The applicability of a near-field scanning optical microscope (NSOM) to measure ultrafast phenomena is experimentally demonstrated. For this application a commercial NSOM is combined with a picosecond laser sampling system. The ability of this time resolved NSOM to perform function and failure analysis of microwave devices is demonstrated. Measurements of high speed electric signals up to 7.5 GHz via the direct electro-optic sampling technique are performed.

Imaging and controlling plasmonic interference fields at buried interfaces

“…Several optics-based approaches have been developed to meet the challenge of tracking surface-bound SPPs with appropriate resolution, notably dual-colour coherent anti-Stokes Raman scattering (CARS) 5 and scanning-tip-based techniques such as near-field scanning optical microscopy (NSOM) 6 7 8 . In recent years, the spatial and temporal resolution limits of these optical techniques have been pushed to the tens of nm and hundreds of fs 9 10 .…”

External electro-optic measuring system with high spatial resolution and high voltage sensitivity by using an electro-optic solid immersion probe

“…In order to solve this dilemma, a sampling technique has been combined with super microscopes, such as scanning force microscopy, scanning tunnelling microscopy, near-field scanning optical microscopy and so on [11][12][13][14]. However, these measuring systems are very complicated, and some have poor voltage sensitivity, in spite of submicrometre spatial resolution.…”