Time-resolved photoemission electron microscopy of semiconductor interfaces

Kosar, Sofiia; Dani, Keshav M.

doi:10.1016/j.progsurf.2024.100745

Progress in Surface Science

2024

DOI: 10.1016/j.progsurf.2024.100745

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Time-resolved photoemission electron microscopy of semiconductor interfaces

Sofiia Kosar,

Keshav M. Dani

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Cited by 3 publications

References 163 publications

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Imaging Locally Inhomogeneous Properties of Metal Halide Perovskites

Kosar,

De Wolf

2024

Advanced Materials

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Metal halide perovskites (MHPs) are a perfect example of state‐of‐the‐art photovoltaic materials whose compositional and structural diversity, coupled with utilization of low‐temperature processing, can undesirably result in spatially inhomogeneous properties that locally vary within the material. This complexity of MHPs requires sensitive imaging characterization methods at the microscopic level to gauge the impact of such inhomogeneities on device performance and to formulate mitigation strategies. This review consolidates properties of MHPs that are susceptible to local variations and highlights appropriate imaging techniques that can be employed to map them. Inhomogeneities in morphology, emission, electrical response, and chemical composition of MHP thin films are specifically considered, and possible microscopic techniques for their visualization are reviewed. For each type of microscopy, a short discussion about spatial resolution, sample requirements, advantages, and limitations is provided, thus leaving the reader with a guide of available imaging characterization tools to evaluate inhomogeneities of their MHPs.

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Imaging Locally Inhomogeneous Properties of Metal Halide Perovskites

Kosar,

De Wolf

2024

Advanced Materials

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Time-resolved photoelectron spectroscopy at surfaces

Aeschlimann,

Bange,

Bauer

et al. 2025

Surface Science

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Direct Reconstruction of the Band Diagram of Rhombohedral-Stacked Bilayer WSe₂–Graphene Heterostructure via Photoemission Electron Microscopy

Boutchich,

Fukumoto,

Mahmoudi

et al. 2024

ACS Appl. Electron. Mater.

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Time-resolved photoemission electron microscopy of semiconductor interfaces

Cited by 3 publications

References 163 publications

Imaging Locally Inhomogeneous Properties of Metal Halide Perovskites

Imaging Locally Inhomogeneous Properties of Metal Halide Perovskites

Time-resolved photoelectron spectroscopy at surfaces

Direct Reconstruction of the Band Diagram of Rhombohedral-Stacked Bilayer WSe₂–Graphene Heterostructure via Photoemission Electron Microscopy

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Time-resolved photoemission electron microscopy of semiconductor interfaces

Cited by 3 publications

References 163 publications

Imaging Locally Inhomogeneous Properties of Metal Halide Perovskites

Imaging Locally Inhomogeneous Properties of Metal Halide Perovskites

Time-resolved photoelectron spectroscopy at surfaces

Direct Reconstruction of the Band Diagram of Rhombohedral-Stacked Bilayer WSe2–Graphene Heterostructure via Photoemission Electron Microscopy

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Direct Reconstruction of the Band Diagram of Rhombohedral-Stacked Bilayer WSe₂–Graphene Heterostructure via Photoemission Electron Microscopy