Time-to-Fail Extraction Model for the "Mixed-Mode" Reliability of High-Performance SiGe Bipolar Transistors

Panko, D.; Vanhoucke, T.; Campos, Rafael; Hurkx, G.A.M.

doi:10.1109/relphy.2006.251271

Cited by 5 publications

(4 citation statements)

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“…For short stress times (within a few hours), exponent α is around 0.5 for low/medium currents (consistent with [Che09]); on the other hand, it is found that the degradation rate decreases for longer stress times, where α approaches about 0.2. This is important in terms of device lifetime prediction (e.g., [Pan06]): if data are extrapolated from short-time experiments, the effect of degradation within a, e.g., 10-year timeframe would be largely overestimated. It must be remarked that the measured damage evolution does not indicate a trend to saturation within a 1,000-h-long stress time.…”

Section: Long-term MM Stress Characterization On Ihp Devicesmentioning

confidence: 99%

5. Reliability

2018

Southeast Asian Ephemeris

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Section: Long-term MM Stress Characterization On Ihp Devicesmentioning

confidence: 99%

5. Reliability

2018

Southeast Asian Ephemeris

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“…There is generally not a joint probability density function to describe these correlated failure modes; thus, it is a difficult and hot issue to compute the reliability with dependent failure modes in reliability study [1][2][3]. In [4][5][6][7], each failure mode is assumed to be independent when calculating the reliability with many failure modes; then, the series model of system reliability theory is introduced. This method is thought to be less rigorous in theory because the relevance of ultimate state functions among different failure modes is ignored, and the calculation error caused by it is hard to estimate.…”

Section: Introductionmentioning

confidence: 99%

Reliability Model of Mechanical Components with Dependent Failure Modes

Wang

2013

Mathematical Problems in Engineering

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A mechanical component may fail in many modes that are usually not independent. There is generally not a joint probability density function to describe these correlated failure modes. Thus, it is difficult to compute the reliability when considering the correlations between the failure modes. It is supposed that three or more failure modes arise synchronously to be a very small probability event. The relationship between ultimate state functions in different failure modes is established by utilizing linear regression method. A double integration model for reliability of mechanical components with dependent failure modes is built according to stress-strength interference model. In case of square, cube, or exponential relationship between two ultimate state functions, a linear transformation is made. An example of pin that may fail in shear fracture, bruise, or both is discussed. The reliability is compared with that obtained by using Monte Carlo method, which represents that the reliability model with dependent failure modes proposed is correct.

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“…Under such biasing conditions, these devices may encounter mixed mode (MM) degradation [1][2][3][4].…”

Section: Introductionmentioning

confidence: 99%

“…In order to determine lifetime in real product application, one can extrapolate the measured device degradation towards use conditions by making use of the lifetime model presented in [3]. This model incorporates the lifetime dependency on V CB , I E , as well as geometry.…”

Section: Introductionmentioning

confidence: 99%