2012
DOI: 10.1002/cctc.201200063
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Tin(II) Antimonates with Adjustable Compositions: Effects of Band‐Gaps and Nanostructures on Visible‐Light‐Driven Photocatalytic H2 Evolution

Abstract: A series of tin(II)–antimonate photocatalysts with varied Sn content were prepared by altering the ion‐exchange time and reaction temperature to control their physicochemical properties, especially their band‐gaps and nanostructures. Furthermore, the effect of these catalysts on visible‐light‐driven photocatalytic H2‐evolution was also investigated. With an increase in Sn content, the narrowed band‐gaps enhanced the absorption of photons to excite the photogenerated charge carriers. A decrease in nanocrystal s… Show more

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Cited by 13 publications
(10 citation statements)
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“…Bandgap values are estimated from diffuse reflectance data using Kubelka-Munk theory. [34, 35] X-ray photoelectron spectroscopy was conducted on a PHI 5000 Versaprobe II Scanning ESCA microprobe using a monochromatic Al K α X-ray source (1486.6 eV). The base vacuum in the chamber was better than 1.5 × 10 −10 torr.…”
Section: Methodsmentioning
confidence: 99%
“…Bandgap values are estimated from diffuse reflectance data using Kubelka-Munk theory. [34, 35] X-ray photoelectron spectroscopy was conducted on a PHI 5000 Versaprobe II Scanning ESCA microprobe using a monochromatic Al K α X-ray source (1486.6 eV). The base vacuum in the chamber was better than 1.5 × 10 −10 torr.…”
Section: Methodsmentioning
confidence: 99%
“…Bandgap values are estimated using Kubelka-Munk theory. 32, 33 Raman data was collected on a Thermo Nicolet 870 instrument that was coupled to an FT-Raman module. X-ray photoelectron spectroscopy was conducted on a PHI 5000 Versaprobe II Scanning ESCA microprobe using a monochromatic Al K α X-ray source (1486.6 eV).…”
Section: Methodsmentioning
confidence: 99%
“…24,25 Powder X-ray diffraction (XRD) patterns were measured with a Scintag XRD (Cu Ka: l ¼ 0.154 nm) at À45 kV and 40 mA, equipped with divergence (2 mm), scatter (4 mm), column scatter (0.5 mm), and receiving (0.2 mm) slits. Tauc plots were obtained through two formulae: R ¼ 10 ÀA and F(R) ¼ (1 À R) 2 /(2R), where A, R and F(R) stand for absorbance, relative reectance and Kubelka-Munk function, respectively.…”
Section: Characterizationsmentioning
confidence: 99%
“…Tauc plots were obtained through two formulae: R ¼ 10 ÀA and F(R) ¼ (1 À R) 2 /(2R), where A, R and F(R) stand for absorbance, relative reectance and Kubelka-Munk function, respectively. 24,25 Powder X-ray diffraction (XRD) patterns were measured with a Scintag XRD (Cu Ka: l ¼ 0.154 nm) at À45 kV and 40 mA, equipped with divergence (2 mm), scatter (4 mm), column scatter (0.5 mm), and receiving (0.2 mm) slits. Fourier transform infrared reection (FTIR) spectra were obtained with the IR spectrometer (BRUKER-Alpha) and soware (OPUS 6.5).…”
Section: Characterizationsmentioning
confidence: 99%