“…The effects of tin sensitization, and activation steps on EL plating along with substrate properties have been evaluated by Rutherford backscattering [21][22][23], radiochemical tracer analysis [24,25], Mossbauer spectroscopy [26], X-ray fluorescence spectrometry [27] and X-ray photoelectron spectroscopy (XPS) [28]. Challenges of these methods [13,29] underscore a need for rapid, in situ evaluation of tin (II) deposited during sensitization with respect to operational variables, e.g., sensitization time, analyte concentration, aqueous immersion, and acid content.…”