2022
DOI: 10.1590/1980-5373-mr-2022-0245
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TiO2 Antireflection Coating Deposited by Electro-Beam Evaporation: Thin Film Thickness Effect on Weighted Reflectance and Surface Passivation of Silicon Solar Cells

Abstract: Titanium dioxide was extensively used in solar cell industry and currently has been studied to produce passivated contacts in PERC/PERT and TOPCon solar cells. The aim of this paper was to analyze the impact of the thickness of TiO 2 thin films deposited by electro-beam evaporation on the weighted reflectance and the surface passivation on silicon solar cells. Thin films with different thicknesses were deposited to produce PERT solar cells, varying from 50 to 90 nm. The surface passivation was enhanced as the … Show more

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Cited by 1 publication
(5 citation statements)
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“…In a second processed sample, a film thickness of (75 ± 6) nm and (59 ± 3) nm was estimated, before and after firing, respectively. For TiO 2 film deposited by electron beam evaporation and firing process at 860 ºC, Model et al 12 observed a wavelength shift of the minimum spectral reflectance (Δλ min ) of around 40 nm, value similar to that reported by Ly et al 19 . On the contrary, an average Δλ min of 130 nm was observed for the TiO 2 films deposited by APCVD in this work.…”
Section: Resultssupporting
confidence: 76%
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“…In a second processed sample, a film thickness of (75 ± 6) nm and (59 ± 3) nm was estimated, before and after firing, respectively. For TiO 2 film deposited by electron beam evaporation and firing process at 860 ºC, Model et al 12 observed a wavelength shift of the minimum spectral reflectance (Δλ min ) of around 40 nm, value similar to that reported by Ly et al 19 . On the contrary, an average Δλ min of 130 nm was observed for the TiO 2 films deposited by APCVD in this work.…”
Section: Resultssupporting
confidence: 76%
“…The solar cells with the front and rear faces coated with TiO 2 deposited by APCVD reached an efficiency of 15.6% (with V OC = 589.8 mV and J SC = 34.9 mA/cm 2 ), a value 0.3% above than that achieved in previous studies with TiO 2 films deposited by electron beam evaporation 12 . With this process, it is necessary to use high vacuum equipment, requiring longer running times and, thus, resulting in lower throughput.…”
Section: Resultsmentioning
confidence: 50%
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