1999
DOI: 10.1016/s0169-4332(98)00569-8
|View full text |Cite
|
Sign up to set email alerts
|

Tip cleaning and sharpening processes for noncontact atomic force microscope in ultrahigh vacuum

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
24
0

Year Published

2003
2003
2015
2015

Publication Types

Select...
6
3
1

Relationship

0
10

Authors

Journals

citations
Cited by 35 publications
(24 citation statements)
references
References 11 publications
0
24
0
Order By: Relevance
“…Cantilever tips were irradiated with UV light for 15 minutes prior to each experiment to remove organic contaminants. 42 Each cantilever was calibrated using its thermal spectrum in situ prior to imaging and the lever sensitivity determined using force spectroscopy. 43 The experiments were completed in a droplet exposed to the atmosphere within the AFM (a sealed enclosure).…”
Section: Methodsmentioning
confidence: 99%
“…Cantilever tips were irradiated with UV light for 15 minutes prior to each experiment to remove organic contaminants. 42 Each cantilever was calibrated using its thermal spectrum in situ prior to imaging and the lever sensitivity determined using force spectroscopy. 43 The experiments were completed in a droplet exposed to the atmosphere within the AFM (a sealed enclosure).…”
Section: Methodsmentioning
confidence: 99%
“…This can be accomplished by exposure to an oxygen plasma, or by UV-radiation in an oxygen-rich atmosphere. UV-radiation in oxygen also removes carbon contaminants [143]. The resulting surface will be terminated with a high density of silanol groups.…”
Section: Modificationmentioning
confidence: 99%
“…19,20 However, a full quantitative understanding of contrast formation in imaging and atomic precision force controlled manipulation and assembly requires the preparation of force microscopy tips with well defined shape and functionality and great efforts have been made to produce such tips. [21][22][23][24] At present, however, direct evidence and analytical methods for determining the species at the end of the probing tip are generally missing and the accumulation of indirect evidence and trial of controlling the tip apex at the atomic level are significant challenges to understanding NC-AFM imaging…”
mentioning
confidence: 99%