Tip radius preservation for high resolution imaging in amplitude modulation atomic force microscopy

Ramos, Jorge R.

doi:10.1063/1.4892277

Cited by 10 publications

(5 citation statements)

References 26 publications

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“…For this purpose tips were submitted to imaging in the repulsive regime with values of free amplitude close to A c , in order to broaden them and obtain a given desired value. Similar procedures have been proposed in the literature. − In the experiments conducted to produce the data for Figures and tips values were R ≈ 3–40 nm.…”

Section: Resultsmentioning

confidence: 89%

General Parametrization of Persisting Long-Range Nanoscale Phenomena in Force Measurements Emerging under Ambient Conditions

et al. 2015

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Advances in quantification of nanoscale forces are mainly focused on repulsive forces, the sample's stiffness, and related parameters such as deformation. The reactivity and chemistry of the surface however depends on longer range forces that are prevalent in ambient conditions and control functional surfaces. Suitable models and appropriate parametrization of this range, however, are still emerging. Here, we define and employ metrics to parametrize long-range forces and experimental observables in dynamic atomic force microscopy and force measurements in a general way even when suitable physical models are lacking. We find that plateaus in the attractive part of the force that can be of more than 1 nm in range are a general characteristic of surfaces exposed to the ambient environment. These plateaus can be identified directly from force measurements or indirectly from computationally low-cost parameters that we define here. We further demonstrate that the defined metrics can be employed for rapid discrimination between sharp (less than 10 nm in radius) and blunt tips. Thus, our results exemplify the potential use of metrics to quantify phenomena that can lead to useful relationships without the restrictions of assumptions imposed by modeling the underlying physics.

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Section: Resultsmentioning

confidence: 89%

General Parametrization of Persisting Long-Range Nanoscale Phenomena in Force Measurements Emerging under Ambient Conditions

et al. 2015

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“…There are different approaches for the choice of the best regime [17][18][19][20][21]. This selection is quite contradictory as the attraction regime provides the most delicate conditions that guarantee the preservation of the sharpness of the probe [22]. At the same time, if the probe is initially sharp, then this regime requires a very small initial amplitude (A 0 is less than 10-20 nm), which, as noted above, can lead to damage to the probe if it bumps into a steep high wall.…”

Section: Selection Of Scan Parameters In Amplitude Modulation Afmmentioning

confidence: 99%

Two dynamic modes to streamline challenging atomic force microscopy measurements

Temiryazev¹,

Krayev²,

Temiryazeva³

2021

Beilstein J. Nanotechnol.

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The quality of topographic images obtained using atomic force microscopy strongly depends on the accuracy of the choice of scanning parameters. When using the most common scanning method – semicontact amplitude modulation (tapping) mode, the choice of scanning parameters is quite complicated, since it requires taking into account many factors and finding the optimal balance between them. A researcher’s task can be significantly simplified by introducing new scanning techniques. Two such techniques are described: vertical and dissipation modes. Significantly simplified and formalized choice of the imaging parameters in these modes allows addressing a wide range of formerly challenging tasks – from scanning rough samples with high aspect ratio features to molecular resolution imaging.

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“…The specific properties and morphology of samples [ 7 ], such as elasticity or viscoelasticity, [ 8 ] must also be considered when operating the instrument. Moreover, the user must cope with and understand the character of some dynamic variables, such as the sharpness of the tip [ 9 , 10 ], otherwise referred to as the tip radius, R, in high-resolution imaging applications. Perhaps counter-intuitively to the newcomer, the field has rapidly advanced in two extremes—in liquid [ 11 , 12 , 13 , 14 ] and UHV environments [ 15 ]—while several complex phenomena have hindered the imaging and quantification of phenomena in air [ 16 ] with similar resolutions, controls, or throughputs [ 3 ].…”

Section: Introductionmentioning

confidence: 99%

Hydration Dynamics and the Future of Small-Amplitude AFM Imaging in Air

et al. 2021

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Here, we discuss the effects that the dynamics of the hydration layer and other variables, such as the tip radius, have on the availability of imaging regimes in dynamic AFM—including multifrequency AFM. Since small amplitudes are required for high-resolution imaging, we focus on these cases. It is possible to fully immerse a sharp tip under the hydration layer and image with amplitudes similar to or smaller than the height of the hydration layer, i.e., ~1 nm. When mica or HOPG surfaces are only cleaved, molecules adhere to their surfaces, and reaching a thermodynamically stable state for imaging might take hours. During these first hours, different possibilities for imaging emerge and change, implying that these conditions must be considered and reported when imaging.

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Tip radius preservation for high resolution imaging in amplitude modulation atomic force microscopy

Cited by 10 publications

References 26 publications

General Parametrization of Persisting Long-Range Nanoscale Phenomena in Force Measurements Emerging under Ambient Conditions

General Parametrization of Persisting Long-Range Nanoscale Phenomena in Force Measurements Emerging under Ambient Conditions

Two dynamic modes to streamline challenging atomic force microscopy measurements

Hydration Dynamics and the Future of Small-Amplitude AFM Imaging in Air

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