Tip wear and tip breakage in high-speed atomic force microscopes

Strahlendorff, Timo; Dai, Gaoliang; Bergmann, Detlef; Tutsch, Rainer

doi:10.1016/j.ultramic.2019.03.013

Cited by 37 publications

(18 citation statements)

References 28 publications

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“…The commercial CD-tip cantilever has several limitations for 3D probing, such as a crosstalk in the yz - and zy -directions, a strong anisotropy ratio in compliance and small detectable signal for slender and compliant CD tips, as detailed in [ 10 ]. The 3D-Nanoprobe [ 10 ] was designed to overcome these limitations, which might lead to shaft probing [ 18 , 19 , 20 ], tip breakage [ 21 ], or measurement errors. It is based on a rectangular CD tip cantilever and is manufactured with focused ion beam (FIB).…”

Section: Methodsmentioning

confidence: 99%

True 3D Nanometrology: 3D-Probing with a Cantilever-Based Sensor

Thiesler

Ahbe

Tutsch

et al. 2021

Sensors

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State of the art three-dimensional atomic force microscopes (3D-AFM) cannot measure three spatial dimensions separately from each other. A 3D-AFM-head with true 3D-probing capabilities is presented in this paper. It detects the so-called 3D-Nanoprobes CD-tip displacement with a differential interferometer and an optical lever. The 3D-Nanoprobe was specifically developed for tactile 3D-probing and is applied for critical dimension (CD) measurements. A calibrated 3D-Nanoprobe shows a selectivity ratio of 50:1 on average for each of the spatial directions x, y, and z. Typical stiffness values are kx = 1.722 ± 0.083 N/m, ky = 1.511 ± 0.034 N/m, and kz = 1.64 ± 0.16 N/m resulting in a quasi-isotropic ratio of the stiffness of 1.1:0.9:1.0 in x:y:z, respectively. The probing repeatability of the developed true 3D-AFM shows a standard deviation of 0.18 nm, 0.31 nm, and 0.83 nm for x, y, and z, respectively. Two CD-line samples type IVPS100-PTB, which were perpendicularly mounted to each other, were used to test the performance of the developed true 3D-AFM: repeatability, long-term stability, pitch, and line edge roughness and linewidth roughness (LER/LWR), showing promising results.

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Section: Methodsmentioning

confidence: 99%

True 3D Nanometrology: 3D-Probing with a Cantilever-Based Sensor

Thiesler

Ahbe

Tutsch

et al. 2021

Sensors

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“…[29,52] Resistance to wear is important because the high tip velocities made possible by the increased bandwidths of our probes increase the risk that the probes will experience large forces that could damage their tips. [23] To test the wear resistance of our probes, we performed AFM imaging on a 5 × 5 µm 2 area of a hard ultrananocrystalline diamond (UNCD) surface multiple times with a pristine solid cantilever, and with a hollow cantilever prepared from a separate solid cantilever. Prior to the scans, we imaged both tips using transmission electron microscopy (TEM) (see Experimental Section) and using an SEM, and, in addition, after the first and fifth scans, we imaged the tips using an SEM.…”

Section: Resilience Of Hollow Cantileversmentioning

confidence: 99%

“…These contacts can eventually cause tip abrasion and limit the typical lifetime of a probe to only a few imaging cycles. [7,23] A worn-out tip can result in lower resolution or even distorted images, less stable imaging, and inaccurate measurements. To avoid such issues, various wear-resistant cantilevers have been developed.…”

Section: Introductionmentioning

confidence: 99%

Hollow Atomic Force Microscopy Cantilevers with Nanoscale Wall Thicknesses

Cha

Campbell

Hasz

et al. 2021

Small

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“…This is made even more powerful by the fact that even undergraduate and intern researchers can be trained relatively quickly to use these systems, giving them a powerful opportunity to directly peer into the inner workings of macromolecular complexes. With the advent of commercial HS-AFM systems (popular examples are the Cypher VRS from Asylum Research and the JPK NanoRacer by Bruker) and better understanding of tip dynamics, 93 researchers have extended the use of HS-AFM for diverse molecular processes. For example, the Nureki group showed how CRISPR-Cas9 cuts a piece of DNA 94 and the Dekker group showed that yeast condensin exist in both a closed and open state.…”

Section: Introductionmentioning

confidence: 99%

Nano-Surveillance: Tracking Individual Molecules in a Sea of Chromatin

Melters

Dalal

2021

Journal of Molecular Biology

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Chromatin is the epigenomic platform for diverse nuclear processes such as DNA repair, replication, transcription, telomere, and centromere function. In cancer cells, mutations in key processes result in DNA amplification, chromosome translocations, and chromothripsis, severely distorting the natural chromatin state. In normal and diseased states, dozens of chromatin effectors alter the physical integrity and dynamics of chromatin at the level of both single nucleosomes and arrays of nucleosomes folded into 3-dimensional shapes. Integrating these length scales, from the 10 nm sized nucleosome to mitotic chromosomes, whilst jostling within the crowded environment of the cell, cannot yet be achieved by a single technology. In this review, we discuss tools that have proven powerful in the investigation of nucleosome and chromatin fiber dynamics. We also provide a deeper focus into atomic force microscopy (AFM) applications that can bridge diverse length and time scales. Using time course AFM, we observe that chromatin condensation by H1.5 is dynamic, whereas using nano-indentation force spectroscopy we observe that both histone variants and nucleosome binding partners alter material properties of individual nucleosomes. Finally, we demonstrate how high-speed AFM can visualize plasmid DNA dynamics, intermittent nucleosome-nucleosome contacts, and changes in nucleosome phasing along a contiguous chromatin fiber. Altogether, the development of innovative technologies holds the promise of revealing the secret lives of nucleosomes, potentially bridging the gaps in our understanding of how chromatin works within living cells and tissues.

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Tip wear and tip breakage in high-speed atomic force microscopes

Cited by 37 publications

References 28 publications

True 3D Nanometrology: 3D-Probing with a Cantilever-Based Sensor

True 3D Nanometrology: 3D-Probing with a Cantilever-Based Sensor

Hollow Atomic Force Microscopy Cantilevers with Nanoscale Wall Thicknesses

Nano-Surveillance: Tracking Individual Molecules in a Sea of Chromatin

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