2006
DOI: 10.1380/ejssnt.2006.644
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ToF-SIMS analysis of influence of alkylamine compounds in UPW on hydrogen-terminated Si surface

Abstract: Adsorption behaviors of alkylamine compounds in UPW (ultra pure water) on hydrogen-terminated Si(100) were elucidated mainly by ToF-SIMS. Si wafers cleaned by heat treatment in 500• C were etched in 0.38% HF and soaked in water solution of alkylamine after 1 min UPW rinse. The peak intensity of amine molecular ions and SiH/Si ratio detected by ToF-SIMS are considered to be used as a measure of quantity of adsorbed molecules and surface oxidation, respectively. It was found that hydrophobic amine molecules with… Show more

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