ToF-SIMS Studies of Sulfuric Acid Hydrate Films

Abstract

A variety of sulfuric acid hydrate films, formed by the co-deposition of SO3 and H2O on a cooled substrate, have been analyzed using time-of-flight secondary ion mass spectrometry (ToF-SIMS). The films were produced using procedures developed in recent infrared spectroscopic studies. Spectra have been shown to consist of a series of identifiable fragments, the change in intensities of which can be related to changes in temperature and the relative abundance of H2O during the deposition of the film under UHV conditions. Depth profiling of the films shows clear evidence of separate surface species on some films and supports the existence of surface molecular hydrates over a stable bulk hydrate film.

Three‐dimensional mass spectral imaging of HeLa‐M cells – sample preparation, data interpretation and visualisation

“…Time‐of‐flight secondary ion mass spectrometry (ToFSIMS) is widely applicable to many sample types and research areas ranging from atmospheric chemistry to bio‐medical and cellular imaging . It is the rapidly expanding area of biological imaging that has provided much of the impetus for the developments in novel ion beam systems and new instrumentation.…”

“…Time-of-flight secondary ion mass spectrometry (ToFSIMS) is widely applicable to many sample types and research areas ranging from atmospheric chemistry to bio-medical and cellular imaging. [1][2][3] It is the rapidly expanding area of biological imaging that has provided much of the impetus for the developments in novel ion beam systems and new instrumentation. The quest for increased molecular-type secondary ion yields under low primary ion fluence surface analytical conditions led to the implementation of more massive atomic projectiles followed by cluster projectiles such as Au n + and Bi n + and polyatomic primary ions such as SF 5 + and most significantly C 60 + .…”

Localization of ferruginol, a diterpene phenol, in Cryptomeria japonica heartwood by time-of-flight secondary ion mass spectrometry

“…TOF-SIMS has been predominantly used for surface analysis of inorganic materials, and is also applicable to organic materials. Typical applications of TOF-SIMS include the identification of haze on a semiconductor surface (Schwenke et al 1997;Zhao et al 1998), characterization of the surface constituents of polymer (Cohen et al 1995;Galuska 1997;Wien 1997;Medard et al 2002;Coullerez et al 2003) and polymer film (Abel et al 1994;Amemiya et al 2000;Shibamori et al 2003;Fletcher et al 2004), microanalysis of biological specimens (Leonard and Mathieu (1999); Arlinghaus et al 2002;Fartmann et al 2002;Belu et al 2003;McArthur et al 2004;Nygren et al 2004;Saito et al 2005), characterization of surface deposits on pulp fiber Duran 2002, 2003;Kleen et al 2003;Parfitt et. al.…”

Comparison of C60 and GCIB primary ion beams for the analysis of cancer cells and tumour sections

“…[1] Static SIMS, where the primary ion beam dose is restricted so that only 1% of the surface is impacted by a primary ion, allows molecular information to be extracted from the sample that is representative of the chemistry of the sample. [2] The technique has been used in a wide range of studies from atmospheric chemistry [3] to the imaging of zebra finch brains [4] and single cells. [5] For biological analysis, there is a constant desire for increased sensitivity to low concentration species, and this has driven the development of novel ion beams.…”

“…Static SIMS, where the primary ion beam dose is restricted so that only 1% of the surface is impacted by a primary ion, allows molecular information to be extracted from the sample that is representative of the chemistry of the sample . The technique has been used in a wide range of studies from atmospheric chemistry to the imaging of zebra finch brains and single cells …”