2019
DOI: 10.1016/j.apsusc.2019.143583
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Tomographic layer-by-layer analysis of epitaxial iron-silicide nanostructures by DFT-assisted STS

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Cited by 4 publications
(6 citation statements)
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“…As expected, the DOS for the fixed middle layers manifests a similar DOS as the bulk shows. Looking into the DOS of first-layer Fe atoms more closely, we can find a sharp peak centered around −0.8 eV, which is in good agreement with the experimental measurements using in-situ scanning tunneling microscopy [ 17 ]. This sharp peak mainly originates from the Fe layer that is closest to the free surface.…”
Section: Resultssupporting
confidence: 87%
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“…As expected, the DOS for the fixed middle layers manifests a similar DOS as the bulk shows. Looking into the DOS of first-layer Fe atoms more closely, we can find a sharp peak centered around −0.8 eV, which is in good agreement with the experimental measurements using in-situ scanning tunneling microscopy [ 17 ]. This sharp peak mainly originates from the Fe layer that is closest to the free surface.…”
Section: Resultssupporting
confidence: 87%
“…The DOS spectra profiles of Fe atoms for Si-terminated and Fe-terminated interfaces are shown in Figure 3 a,b, respectively. The Fe atoms at the free surface (A and A’) exhibit similar DOS as in the free-standing nanoslab without Si substrate ( Figure 2 b), all of which show the characteristic sharp peak centered around −0.8 eV that matches the experimental measurement [ 17 ]. On the contrary, the interface Fe atoms (B and B’) manifest different DOS features for both types.…”
Section: Resultssupporting
confidence: 60%
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