Handbook of Microscopy for Nanotechnology
DOI: 10.1007/1-4020-8006-9_19
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Tomography Using the Transmission Electron Microscope

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Cited by 4 publications
(1 citation statement)
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“…Electron tomography makes it possible to study the three-dimensional nanotube-metal contact geometry which determines the electrical contact resistance to the nanotubes (courtesy of J. Cha, M. Weyland, and D. Muller, 2006). (2003), Midgley (2005), Weyland et al (2006) and Kawase et al (2007). gress of these techniques, which has culminated in a remarkable near-…”
Section: Peter W Hawkes John Ch Spencementioning
confidence: 99%
“…Electron tomography makes it possible to study the three-dimensional nanotube-metal contact geometry which determines the electrical contact resistance to the nanotubes (courtesy of J. Cha, M. Weyland, and D. Muller, 2006). (2003), Midgley (2005), Weyland et al (2006) and Kawase et al (2007). gress of these techniques, which has culminated in a remarkable near-…”
Section: Peter W Hawkes John Ch Spencementioning
confidence: 99%