Tomography with grating interferometers at low-brilliance sources

Weitkamp, Timm; Dávid, Christian; Kottler, Christian; Bunk, Oliver; Pfeiffer, Franz

doi:10.1117/12.683851

Cited by 142 publications

(126 citation statements)

References 15 publications

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“…The duty cycle and the transmission of the grating lines of G0 are given by κ 0 and τ 0 , respectively. The transmission function of G2 can be expressed as [16] G(x) = T κ 2 ,τ 2 (x), (2.9) which again uses the rectangular pulse train function T κ,τ (x) displayed in figure 2, with the duty cycle κ 2 and the transmission τ 2 . The visibility V is defined as the normalized amplitude of I p (x) (equation (2.4)), given by [14] …”

Section: System Parameters and Performance Metrics (A) System Parametersmentioning

confidence: 99%

“…Assuming a monochromatic beam and taking into account the finite source size, the continuous (unsampled) phase-stepping curve is given by a convolution of the coherent interference pattern I c (x), the projected sourceintensity profile S (x) and the transmission function G(x) of G2 [16], source profiles of the Talbot-type and Talbot-Lau-type interferometers are treated separately by using S T (x) (Talbot) and S TL (x) (Talbot-Lau) and are expressed as [16] …”

Section: System Parameters and Performance Metrics (A) System Parametersmentioning

confidence: 99%

“…It can be distinguished between two types of interferometers, the Talbot-type interferometer [1,2], which uses two gratings (G1 and G2), and the Talbot-Lau-type interferometer [4], which uses an additional grating (G0). The beam splitter grating, or G1, is a phase grating which generates a periodic interference pattern of period p 2 with maximum intensity oscillations at the distances d = d m , which are given by [16] Figure 1. System parameters of a grating interferometer.…”

Section: Introductionmentioning

confidence: 99%

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Performance and optimization of X-ray grating interferometry

Thuering

Stampanoni

2014

Phil. Trans. R. Soc. A.

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The monochromatic and polychromatic performance of a grating interferometer is theoretically analysed. The smallest detectable refraction angle is used as a metric for the efficiency in acquiring a differential phase-contrast image. Analytical formulae for the visibility and the smallest detectable refraction angle are derived for Talbot-type and Talbot-Lau-type interferometers, respectively, providing a framework for the optimization of the geometry. The polychromatic performance of a grating interferometer is investigated analytically by calculating the energydependent interference fringe visibility, the spectral acceptance and the polychromatic interference fringe visibility. The optimization of grating interferometry is a crucial step for the design of application-specific systems with maximum performance.

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Section: System Parameters and Performance Metrics (A) System Parametersmentioning

confidence: 99%

Section: System Parameters and Performance Metrics (A) System Parametersmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Performance and optimization of X-ray grating interferometry

Thuering

Stampanoni

2014

Phil. Trans. R. Soc. A.

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“…[2][3][4][5][6][7][8] For a long time, these methods have been practically limited to highly brilliant radiation as it is available at, e.g., synchrotron radiation sources. Recently, the development of grating interferometers extended x-ray phase-contrast imaging even to conventional x-ray tube sources, [9][10][11] making the grating-based x-ray phase-contrast imaging feasible also at low-coherent second generation synchrotron radiation sources. These radiation sources provide several orders of magnitude more flux than conventional x-ray tubes, but a much lower brilliance than third generation sources such as, e.g., ESRF/France or PETRA III/Germany.…”

Section: Introductionmentioning

confidence: 99%

“…de. impossible. The phase-contrast method using a three-grating interferometer has been used with incoherent sources (x-ray tubes and neutrons [10][11][12][13] ). We have transferred this design to a wiggler beamline and used it to explore the entire role of the source grating and its influence on the phase-contrast imaging, which has not been investigated so far.…”

Section: Introductionmentioning

confidence: 99%

X-ray grating interferometer for materials-science imaging at a low-coherent wiggler source

Herzen

Donath²,

Beckmann³

et al. 2011

Review of Scientific Instruments

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Endstation for ultrafast magnetic scattering experiments at the free-electron laser in Hamburg Rev. Sci. Instrum. 84, 013906 (2013) Impact system for ultrafast synchrotron experiments Rev. Sci. Instrum. 84, 013904 (2013) A digital miniature x-ray tube with a high-density triode carbon nanotube field emitter Appl. Phys. Lett. 102, 023504 (2013) Active diffraction gratings: Development and tests Rev. Sci. Instrum. 83, 123106 (2012) Orientation-selective X-ray dark field imaging of ordered systems J. Appl. Phys. 112, 114903 (2012) Additional information on Rev. Sci. Instrum. X-ray phase-contrast radiography and tomography enable to increase contrast for weakly absorbing materials. Recently, x-ray grating interferometers were developed that extend the possibility of phasecontrast imaging from highly brilliant radiation sources like third-generation synchrotron sources to non-coherent conventional x-ray tube sources. Here, we present the first installation of a three grating x-ray interferometer at a low-coherence wiggler source at the beamline W2 (HARWI II) operated by the Helmholtz-Zentrum Geesthacht at the second-generation synchrotron storage ring DORIS (DESY, Hamburg, Germany). Using this type of the wiggler insertion device with a millimeter-sized source allows monochromatic phase-contrast imaging of centimeter sized objects with high photon flux. Thus, biological and materials-science imaging applications can highly profit from this imaging modality. The specially designed grating interferometer currently works in the photon energy range from 22 to 30 keV, and the range will be increased by using adapted x-ray optical gratings. Our results of an energy-dependent visibility measurement in comparison to corresponding simulations demonstrate the performance of the new setup.

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X‐Ray Computed Tomography

Stock

2012

Characterization of Materials

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X‐ray computed tomography (CT) is a powerful technique for noninvasively characterizing materials. This chapter covers x‐ray computed tomography (CT) in its forms spanning large components (booster rockets) to millimeter‐sized material specimens to micrometer‐sized samples. Emphasis is on contrast produced by differences in x‐ray attenuation, although CT using x‐ray phase contrast, x‐ray fluorescence, or x‐ray diffraction is also covered briefly.

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Tomography with grating interferometers at low-brilliance sources

Cited by 142 publications

References 15 publications

Performance and optimization of X-ray grating interferometry

Performance and optimization of X-ray grating interferometry

X-ray grating interferometer for materials-science imaging at a low-coherent wiggler source

X‐Ray Computed Tomography

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