Topographic Study of Fe70co30and Ni80fe20of Various Thickness for Spin Valve Application

Abstract

FeCo and NiFe thin films of various thickness were prepared on silicon substrate using UHV DC Magnetron Sputtering. The thickness of the film was studied using stylus profilometer.Topography of the surface was studied by AFM which confirms roughness of the film, increases with increasein film thickness. Magnetic properties of the film were studied using VSM analysis.We observe that the magnetic properties of FeCo and NiFe thin filmvaries with film thickness. SEM-EDS analysis confirms purity of the films.