2014
DOI: 10.1007/978-3-319-06986-9_3
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Topography of Rough Dielectric Surfaces Utilizing Evanescent Illumination

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Cited by 1 publication
(4 citation statements)
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“…The basic aspects of the theory and the application of high precision optical contouring methods used in this paper are contained in Sciammarella et al (2005), Sciammarella et al (2008a), Sciammarella et al (2008b), Sciammarella et al (2010) and Sciammarella et al (2015). This paper introduces new developments that are particularly suitable for the task of determining the volume of prismatic depositions with irregular contours.…”
Section: Methodology For High-precision Optical Contouring Of Am Componentsmentioning
confidence: 99%
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“…The basic aspects of the theory and the application of high precision optical contouring methods used in this paper are contained in Sciammarella et al (2005), Sciammarella et al (2008a), Sciammarella et al (2008b), Sciammarella et al (2010) and Sciammarella et al (2015). This paper introduces new developments that are particularly suitable for the task of determining the volume of prismatic depositions with irregular contours.…”
Section: Methodology For High-precision Optical Contouring Of Am Componentsmentioning
confidence: 99%
“…(2015). In some cases, sub-micron accuracy was obtained to determine the surface roughness of metallic surfaces (Sciammarella et al, 2015). A very important procedural aspect that made this practical solution possible was the development of a new unwrapping technique that allows to extract the depth information by a self-adjusting algorithm.…”
Section: Computation Of the Volume Of The Lateral Facesmentioning
confidence: 99%
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