In situ spectroscopy of intrinsic Bi2Te3 topological insulator thin films and impact of extrinsic defects Ngabonziza, P.; Heimbuch, R.; de Jong, N.; Klaassen, R.A.; Stehno, M.P.; Snelder, M.; Solmaz, A.; Ramankutty, S.V.; Frantzeskakis, E.; van Heumen, E.; Koster, G.; Golden, M.S.; Zandvliet, H.J.W.; Brinkman, A.
Published in:Physical Review B
DOI:10.1103/PhysRevB.92.035405
Link to publicationCitation for published version (APA): Ngabonziza, P., Heimbuch, R., de Jong, N., Klaassen, R. A., Stehno, M. P., Snelder, M., ... Brinkman, A. (2015). In situ spectroscopy of intrinsic Bi2Te3 topological insulator thin films and impact of extrinsic defects. Physical Review B, 92(3), [035405]. https://doi.org/10.1103/PhysRevB.92.035405
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Disclaimer/Complaints regulationsIf you believe that digital publication of certain material infringes any of your rights or (privacy) interests, please let the Library know, stating your reasons. In case of a legitimate complaint, the Library will make the material inaccessible and/or remove it from the website. Please Ask the Library: http://uba.uva.nl/en/contact, or a letter to: Library of the University of Amsterdam, Secretariat, Singel 425, 1012 WP Amsterdam, The Netherlands. You will be contacted as soon as possible. Combined in situ x-ray photoemission spectroscopy, scanning tunneling spectroscopy, and angle resolved photoemission spectroscopy of molecular beam epitaxy grown Bi 2 Te 3 on lattice mismatched substrates reveal high quality stoichiometric thin films with topological surface states without a contribution from the bulk bands at the Fermi energy. The absence of bulk states at the Fermi energy is achieved without counterdoping. We observe that the surface morphology and electronic band structure of Bi 2 Te 3 are not affected by in vacuo storage and exposure to oxygen, whereas major changes are observed when exposed to ambient conditions. These films help define a pathway towards intrinsic topological devices.