Total cross sections for different charge changing processes in collisions of highly charged Xe ions with He atoms at low energy

Andersson, H.; Astner, G.; Cederquist, H.

doi:10.1088/0953-4075/21/8/003

Cited by 42 publications

(19 citation statements)

References 13 publications

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“…In the slow collisions of multiply charged ions with He gas, single-electron capture (SEC), true double-electron capture (TDC), and transfer ionization (TI) take place as inelastic reaction processes. Generally speaking, SEC can be regarded as the most dominant one as seen in collisions of Xe q+ (q = 10-43 ) and Ar q+ (q = 8-16) [21,22,23]. Therefore, we can assume that the observed emissions come from the ions in one less charge states than the incident ionic charge q+, i.e.…”

Section: Resultsmentioning

confidence: 99%

4d-4f unresolved transition arrays of xenon and tin ions in charge exchange collisions

Tanuma

Ohashi

Fujioka

et al. 2007

J. Phys.: Conf. Ser.

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Abstract. Extreme ultra-violet emission spectra of multiply charged Xe and Sn ions are measured following the electron capture in collisions with He. After the assumption of singleelectron capture, we have found that the wide range of charge states, Sn 10+ to Sn 14+ for tin ions, and Xe 11+ to Xe 17+ for xenon ions, have the prominent emissions at 13.5 and 11.0 nm, respectively. These emissions are attributed to the 4d-4f unresolved transition arrays in comparison with the results of theoretical calculations by using the HULLAC code.

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Section: Resultsmentioning

confidence: 99%

4d-4f unresolved transition arrays of xenon and tin ions in charge exchange collisions

Tanuma

Ohashi

Fujioka

et al. 2007

J. Phys.: Conf. Ser.

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“…In other words, a significant part of the 132Xe2+ ions must have been formed via a double electron transfer from neutral xenon to the I3*Xe4+ ion as exemplified by Reaction (4). This reaction also can (1) ( 2 ) ( 3 ) (4) account for the observed peaks due to the doubly charged ions of the other xenon isotopes which are generated concomitantly (see Figs 3 and 4). If Reaction (4) were the only channel for the generation of doubly charged xenon ions, then the sum of the peak intensities of all natural xenon isotope ions, formed through double ionization of natural xenon gas atoms, should be equal to the difference obtained by subtraction of the natural 13'Xe2+ isotope peak intensity from the observed '32Xe2+ isotope peak intensity.…”

Section: Resultsmentioning

confidence: 96%

Double‐electron transfer from Xe to Xe⁴⁺ at low energies as observed in the trap of a fourier‐transform ion cyclotron resonance mass spectrometer

Köding

Pinkse

Nibbering

1993

Rapid Comm Mass Spectrometry

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Multiply charged Xe"' ions with n < 5 were generated by electron impact on xenon gas in the external ion source of a Fourier-transform ion cyclotron resonance (FT-ICR) mass spectrometer. These ions were transferred to and trapped in the low pressure FT-ICR cell. Subsequently, xenon ions with a particular mass and charge state were selected by ejection of all other unwanted ions from the FT-ICR cell and allowed to react with neutral xenon atoms. It was found that, in the interactions between Xe4+ ions and neutral xenon atoms, not only does a single electron transfer take place, but also a double electron transfer.Various groups have studied, during the last decade, electron-transfer reactions between multiply charged ions and atoms or molecules in the high-energy collision domain, that is &,,a 1 keV.'-' Much less research, however, has been published on such reactions in the low-to near-thermal-energy collision range. Only very recently, a few papers have appeared which describe, for low-energy collision conditions, single-and doubleelectron transfer from simple molecules to He2+ ions6 and, in terms of multi-electron capture processes, the interactions between C4+ ions and simple aliphatic hydrocarbons.' This has prompted us to report some preliminary results that we have obtained as part of a collaborative European Community project (see acknowledgement) on the chemistry and physics of highly charged atomic ions in ion traps. The main goal of our work in this project was to generate highly charged atomic ions with a relatively simple experimental set-up and to investigate the different possible reaction pathways in the interactions of these ions with atoms or molecules by the use of the Fourier-transform ion cyclotron resonance (FT-ICR) mass spectrometric technique. In the present paper, some observations concerning the interactions between multiply charged xenon ions and atoms are described. EXPERIMENTALThe experiments were performed using a Bruker Spectrospin CMS 47X FT-ICR mass spectrometer (Bruker Spectrospin AG, Fallanden, Switzerland), equipped with a 4.7 T superconducting magnet, an external ion source and a Bruker Aspect 3000 data system.8 The general operating procedures for ion manipulation (selection/detection) have been described previously. '. lo The multiply charged Xe"+ ions with n s 5 were generated in the external ion source by electron impact (EI) of xenon gas at an ion-gauge indicated pressure of about 1 X mbar. The energy of the bombarding electrons was set at 350 eV and not further increased, so as to prevent an electric breakdown, while the * Author to whom correspondence should be addressed. current of the incident electron beam was held at 50pA. Ions generated in the ion source near ground potential were extracted from the source, focused into a beam by acceleration through a potential of 3 kV and axially injected into the magnetic field and ICR-cell section. Once injected, the ions were decelerated until they had a translational energy close to or lower than 1 eV, as determined by the p...

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“…In slow collisions of multiply charged ions with He, single electron capture may be regarded as the dominant process with transfer ionisation making a significant contribution [5][6][7][8][9]. Therefore the final charge states in the production of Sn and Xe ions due to collisions of Sn q+ with He and Xe q+ with He are Sn (q-1)+ and Xe (q-1)+ respectively.…”

Section: Resultsmentioning

confidence: 99%

Configuration interaction in charge exchange spectra of tin and xenon

D’Arcy¹,

Morris²,

Ohashi³

et al. 2011

Phys. Scr.

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Abstract. Charge state specific extreme ultraviolet spectra from both tin ions and xenon ions have been recorded at Tokyo Metropolitan University. The Electron Cyclotron Resonance Source spectra were produced from charge exchange collisions between the ions and rare gas target atoms. In order to identify unknown spectral lines of tin and xenon, atomic structure calculations were performed for Sn 14+ -Sn 17+ and for Xe 16+ -Xe 20+ using the Hartree-Fock with Configuration Interaction code of Cowan. The energies of the capture states involved in the single electron process that occurs in these slow collisions are estimated using the classical over barrier model. IntroductionCharge state specific spectra from a range of tin and xenon ions have been recorded in the extreme ultraviolet (EUV) wavelength region at Tokyo Metropolitan University. The study was prompted by the importance of these species in source development for EUV lithography and metrology at the operating wavelength set by industry of 13.5nm [1]. In Sn, an intense unresolved transition array (UTA) resulting from 4p 6 4d n -4p 5 4d n+1 + 4p 6 4d n-1 4f transitions in Sn IX through Sn XIII emits at the desired wavelength [2,3]. However as the spectra from individual ion stages overlap in energy and plasma sources always contain a range of ion stages, unambiguous line identification is almost impossible in such regions of high line density. Thus ion separation techniques are an essential prerequisite to any analysis. In this work, we report on the EUV emission spectra of multiply charged Sn and Xe ions measured following electron capture in collisions with He.

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Total cross sections for different charge changing processes in collisions of highly charged Xe ions with He atoms at low energy

Cited by 42 publications

References 13 publications

4d-4f unresolved transition arrays of xenon and tin ions in charge exchange collisions

4d-4f unresolved transition arrays of xenon and tin ions in charge exchange collisions

Double‐electron transfer from Xe to Xe⁴⁺ at low energies as observed in the trap of a fourier‐transform ion cyclotron resonance mass spectrometer

Configuration interaction in charge exchange spectra of tin and xenon

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Total cross sections for different charge changing processes in collisions of highly charged Xe ions with He atoms at low energy

Cited by 42 publications

References 13 publications

4d-4f unresolved transition arrays of xenon and tin ions in charge exchange collisions

4d-4f unresolved transition arrays of xenon and tin ions in charge exchange collisions

Double‐electron transfer from Xe to Xe4+ at low energies as observed in the trap of a fourier‐transform ion cyclotron resonance mass spectrometer

Configuration interaction in charge exchange spectra of tin and xenon

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Double‐electron transfer from Xe to Xe⁴⁺ at low energies as observed in the trap of a fourier‐transform ion cyclotron resonance mass spectrometer