Total Dose and Single Event Testing of the Intersil ISL75051SRH Low Dropout Regulator

Vonno, N. W. van; Pearce, L.; Knudsen, K.; Thomson, E. J.; Bernard, T. M.; Chesley, P. J.

doi:10.1109/redw.2012.6353708

2012 IEEE Radiation Effects Data Workshop 2012

DOI: 10.1109/redw.2012.6353708

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Total Dose and Single Event Testing of the Intersil ISL75051SRH Low Dropout Regulator

N. W. van Vonno

L. Pearce

K. Knudsen

et al.

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Cited by 7 publications

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Total Dose and Single Event Testing of the Intersil ISL75051SRH Low Dropout Regulator

Cited by 7 publications

References 2 publications

Power solution for DDR memory in space applications

Power solution for DDR memory in space applications

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Total Dose and SEE Testing of the Intersil ISL75052SEH Low Dropout Regulator

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