21st International Conference on VLSI Design (VLSID 2008) 2008
DOI: 10.1109/vlsi.2008.29
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Total Power Minimization in Glitch-Free CMOS Circuits Considering Process Variation

Abstract: Compared to subthreshold leakage, dynamic power is normally much less sensitive to the process variation due to its approximately linear relation to the process parameters. However, the average dynamic power of a circuit optimized by deterministic glitch elimination (using hazard filtering and path balancing) increases because glitches randomly start reappearing under the influence of process variation. Combining existing techniques, we propose a new statistical mixed integer linear programming (MILP) formulat… Show more

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Cited by 3 publications
(2 citation statements)
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“…A circuit engineer should be ready to face the challenge and be able to come up with the optimum design of the circuit. Simultaneously the inconsistent surge in various important technical characteristics might considerably upset the formulation and attainment of correct and least power consumed ICs in nanometer arrangement [11]. Gate Sizing Optimization is crucial to obtain timing closure and minimize the power dissipation of integrated circuits [12].…”
Section: Introductionmentioning
confidence: 99%
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“…A circuit engineer should be ready to face the challenge and be able to come up with the optimum design of the circuit. Simultaneously the inconsistent surge in various important technical characteristics might considerably upset the formulation and attainment of correct and least power consumed ICs in nanometer arrangement [11]. Gate Sizing Optimization is crucial to obtain timing closure and minimize the power dissipation of integrated circuits [12].…”
Section: Introductionmentioning
confidence: 99%
“…second Stage gain is obtained as in(11),(12), (the third Transistor is calculated that is equal to the fourth transistor to determine and meet the upper Limit of ICMR as shown in(15) and(16).…”
mentioning
confidence: 99%