Total reflection X-ray fluorescence study of organic nanostructures

Zheludeva, S. I.; Kovalchuk, M. V.; Новикова, Н. Н.

doi:10.1016/s0584-8547(01)00314-7

Cited by 19 publications

(12 citation statements)

References 12 publications

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“…This magnitude does not correlate with the experimental values of the diameter of the interference area obtained in Ref. 22 and, in further investigations, 31,32 with the magnitude of the coherence length of the reflecting radiation. These experimental results led to attempts for model development based on the concept of radiation spatial coherence.…”

Section: The Waveguide Resonance Model In the Light Of X-ray Flux Spacontrasting

confidence: 67%

Background of x‐ray nanophotonics based on the planar air waveguide resonator

Egorov

2007

X-Ray Spectrometry

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The work elucidates some model details of x-ray flux waveguide resonance propagation through a planar, narrow, extended slit. The phenomenological substantiation of the correctness of the introduction of the waveguide resonance model is confirmed on the basis of the concept of flux spatial coherence. The peculiarities of the model realization in various designs of planar x-ray waveguide resonators (PXWR) are discussed. The main fields of practical application of PXWRs are characterized by experimental results. Nanophotonics perspectives using waveguide resonance structures are outlined.

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Section: The Waveguide Resonance Model In the Light Of X-ray Flux Spacontrasting

confidence: 67%

Background of x‐ray nanophotonics based on the planar air waveguide resonator

Egorov

2007

X-Ray Spectrometry

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“…[1][2][3][4][5][6][7] It has also been demonstrated that x-ray waveguide structures provide a powerful tool to study the structural properties of the guiding layer itself. 5,[9][10][11] The excitation of waveguide modes in planar structures was demonstrated by Feng et al, 1 where a resonance enhancement of the intensity by 20-fold was observed inside the waveguide cavity consisting of a polyimide film sandwiched between Si substrate and SiO 2 top layer. Resonance modes of such a planar waveguide are excited for angle of incidence of x rays satisfying the condition i = m ϵ͑m +1͒ / kW, where k is the propagation vector of the x-rays and W is the width of the cavity, and m is an integer.…”

Section: Introductionmentioning

confidence: 99%

Depth profiling of marker layers using x-ray waveguide structures

et al. 2005

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It is demonstrated that x-ray waveguide structures can be used for depth profiling of a marker layer inside the guiding layer with an accuracy of better than 0.2 nm. A combination of x-ray fluorescence and x-ray reflectivity measurements can provide detailed information about the structure of the guiding layer. The position and thickness of the marker layer affect different aspects of the angle-dependent x-ray fluorescence pattern, thus making it possible to determine the structure of the marker layer in an unambiguous manner. As an example, effects of swift heavy ion irradiation on a Si/ M / Si trilayer ͑M = Fe, W͒, forming the cavity of the waveguide structure, have been studied. It is found that in accordance with the prediction of thermal spike model, Fe is much more sensitive to swift heavy ion induced modifications as compared to W, even in thin film form. However, a clear evidence of movement of the Fe marker layer towards the surface is observed after irradiation, which cannot be understood in terms of the thermal spike model alone.

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“…The possibilities of the XRSW technique for determining the position of atoms in ultra-thin surface layers have been demonstrated elsewhere [9][10][11][12][13][14]. The basic points of this technique are as follows.…”

Section: Investigation Of Thin Films By X-ray Standing Wave Methodsmentioning

confidence: 99%

“…The great potential have spectral Xray techniques such as X-ray standing wave method (XRSW method) that combines the advantages of high-resolution X-ray experiments with spectroscopic selectivity of obtained data [9][10][11][12][13][14]. XRSW measurements are based on recording along with angular dependence of reflected X-ray beam the yield of characteristic X-ray fluorescence.…”

Section: Introductionmentioning

confidence: 99%