“…Synchrotron X-ray beams, characterized by high intensity and wide energy tunability, enable time-resolved in situ investigations that are crucial due to the nonequilibrium and complex nature of synthesis processes. , Diffraction data can be readily obtained in just a few minutes, offering comprehensive insights into phase transitions, atomic ordering, bond lengths, crystallite sizes, and microstrains throughout the synthesis process. Recent advances in laboratory X-ray diffractometers now enable the acquisition of structural information during synthesis. , However, these instruments frequently encounter data distortions due to reflection geometry, which can lead to peak shifts and a loss of peak intensity at low angles, often resulting from sample contraction or expansion at high temperatures. Moreover, these systems require longer data acquisition times, necessitating the careful design of experimental procedures.…”