2023
DOI: 10.1002/adfm.202306654
|View full text |Cite
|
Sign up to set email alerts
|

Toward a Nanoscale‐Defect‐Free Ni‐Rich Layered Oxide Cathode Through Regulated Pore Evolution for Long‐Lifespan Li Rechargeable Batteries

Seok Hyun Song,
Hwa Soo Kim,
Kyoung Sun Kim
et al.

Abstract: Ni‐rich layered oxides are envisioned as the most promising cathode materials for next‐generation lithium‐ion batteries; however, their practical adoption is plagued by fast capacity decay originating from chemo‐mechanical degradation. The intrinsic chemical–mechanical instability, inherited from atomic‐ and nanoscale defects generated during synthesis, is not yet resolved. Here, atomic‐ and nanoscale structural evolution during solid‐state synthesis of Ni‐rich layered cathode, Li[Ni0.92Co0.03Mn0.05]O2, is inv… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
6
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
5

Relationship

2
3

Authors

Journals

citations
Cited by 5 publications
(6 citation statements)
references
References 51 publications
0
6
0
Order By: Relevance
“…Tracking crystal structural changes within layered cathode materials synthesized using various approaches has been conducted through extensive ex situ diffraction analyses, combined with Rietveld refinements of powder diffraction patterns . The diffraction technique, a long-established method for identifying crystal structures, commonly utilizes XRD with X-rays sourced from both laboratory diffractometers and synchrotrons.…”
Section: Atomic-scale Characterization Of Layered Cathode Materials U...mentioning
confidence: 99%
See 4 more Smart Citations
“…Tracking crystal structural changes within layered cathode materials synthesized using various approaches has been conducted through extensive ex situ diffraction analyses, combined with Rietveld refinements of powder diffraction patterns . The diffraction technique, a long-established method for identifying crystal structures, commonly utilizes XRD with X-rays sourced from both laboratory diffractometers and synchrotrons.…”
Section: Atomic-scale Characterization Of Layered Cathode Materials U...mentioning
confidence: 99%
“…Synchrotron X-ray beams, characterized by high intensity and wide energy tunability, enable time-resolved in situ investigations that are crucial due to the nonequilibrium and complex nature of synthesis processes. , Diffraction data can be readily obtained in just a few minutes, offering comprehensive insights into phase transitions, atomic ordering, bond lengths, crystallite sizes, and microstrains throughout the synthesis process. Recent advances in laboratory X-ray diffractometers now enable the acquisition of structural information during synthesis. , However, these instruments frequently encounter data distortions due to reflection geometry, which can lead to peak shifts and a loss of peak intensity at low angles, often resulting from sample contraction or expansion at high temperatures. Moreover, these systems require longer data acquisition times, necessitating the careful design of experimental procedures.…”
Section: Atomic-scale Characterization Of Layered Cathode Materials U...mentioning
confidence: 99%
See 3 more Smart Citations