Toward Reliable Industrial Radiation Thermometry

Yamada, Yoshiro; Ishii, Juntaro

doi:10.1007/s10765-015-1870-y

Cited by 14 publications

(6 citation statements)

References 5 publications

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“…In reality, the two conditions will never have exactly proportional angular reflectance distribution; in this sense, the technique involves an approximation. How well the approximation holds depends, case by case, and it is difficult to analytically determine how well this approximation will hold [16]. Therefore, this study aims to verify that the principle holds and to quantify the effect of the approximation error experimentally.…”

Section: Principle Of the Dwr Methodsmentioning

confidence: 99%

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Emissivity-free radiation thermometry for high-temperature metals using the dual-wavelength reflectance-ratio method

Kobatake¹,

Kurokawa²,

Iwabuchi³

et al. 2022

Meas. Sci. Technol.

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This article describes a preliminary study verifying the applicability of the dual-wavelength reflectance-ratio (DWR) method to emissivity-free radiation thermometry for electromagnetically levitated high-temperature liquid metals. To establish the measurement technique, the DWR method was applied to inductively heated solid spherical Cu and Ni samples. Regardless of the differences in the sample emissivity values, the temperature determined using the DWR method agreed within 20 K with the temperature determined using a thermocouple. It was found that the temperatures of metallic samples having different emissivity values can be determined with a standard uncertainty of 8 K in terms of the absolute temperature when applying the DWR method, even if the sample has curvature and is exposed to high temperatures of up to 1250 K.

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Section: Principle Of the Dwr Methodsmentioning

confidence: 99%

“…Yamada et al [13][14][15][16] developed emissivity-free radiation thermometry using the dual-polarization or dual-wavelength reflectance-ratio (DWR) method. They succeeded in measuring the surface temperature of a silicon wafer and a stainlesssteel plate during thermal processing using this technique [13,15].…”

Section: Introductionmentioning

confidence: 99%

Emissivity-free radiation thermometry for high-temperature metals using the dual-wavelength reflectance-ratio method

Kobatake¹,

Kurokawa²,

Iwabuchi³

et al. 2022

Meas. Sci. Technol.

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show abstract

“…This problem also exists in two-color thermography [ 4 ]. Overestimation of temperature in pixels surrounding the hottest zone will be more significant in two-color than in single-band thermography due to the reduced sensitivity of the technique [ 20 ].…”

Section: Introductionmentioning

confidence: 99%

Reconstruction of Microscopic Thermal Fields from Oversampled Infrared Images in Laser-Based Powder Bed Fusion

Stanger

Rockett

Lyle

et al. 2021

Sensors

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This article elucidates the need to consider the inherent spatial transfer function (blur), of any thermographic instrument used to measure thermal fields. Infrared thermographic data were acquired from a modified, commercial, laser-based powder bed fusion printer. A validated methodology was used to correct for spatial transfer function errors in the measured thermal fields. The methodology was found to make a difference of 40% to the measured signal levels and a 174 °C difference to the calculated effective temperature. The spatial gradients in the processed thermal fields were found to increase significantly. These corrections make a significant difference to the accuracy of validation data for process and microstructure modeling. We demonstrate the need for consideration of image blur when quantifying the thermal fields in laser-based powder bed fusion in this work.

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“…Some studies have attributed the influence of reflection to emissivity, which were eliminated by color thermometry. This method is limited to the target surface temperature being higher than or similar to the ambient temperature; then, the target radiation is equal to that of a blackbody, and the emissivity can be assumed to be 1 [11]. This method is simple but has limited applicability.…”

Section: Introductionmentioning

confidence: 99%

Error analysis and reflection correction for radiation temperature measurements at high background temperatures

Gao

Zhao

Chen

et al. 2021

Meas. Sci. Technol.

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Advances in science and technology have increased the demand for greater temperature measurement accuracy. Radiation thermometry is a mature technology that is applicable to various industrial fields. In special environments (e.g. a high ambient temperature), background radiation reflected by the target surface is superimposed with the radiation from the target itself, which affects the measured radiation temperature. In this study, different radiation thermometry methods were evaluated. The errors of single-spectral, colorimetric, and multispectral temperature measurements of targets in a high-temperature environment have been discussed. Based on this, we propose a multi-wavelength temperature measurement method with reflection correction to reduce the impact of high-temperature environment. Experiments show that this method can reduce the uncertainty in the multispectral temperature measurement from 4.16% to 0.26% under the experimental conditions.

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Toward Reliable Industrial Radiation Thermometry

Cited by 14 publications

References 5 publications

Emissivity-free radiation thermometry for high-temperature metals using the dual-wavelength reflectance-ratio method

Emissivity-free radiation thermometry for high-temperature metals using the dual-wavelength reflectance-ratio method

Reconstruction of Microscopic Thermal Fields from Oversampled Infrared Images in Laser-Based Powder Bed Fusion

Error analysis and reflection correction for radiation temperature measurements at high background temperatures

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