2016
DOI: 10.1103/physrevlett.117.106401
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Toward the Intrinsic Limit of the Topological InsulatorBi2Se3

Abstract: Combining high resolution scanning tunneling microscopy and first principles calculations, we identified the major native defects, in particular the Se vacancies and Se interstitial defects, that are responsible for the bulk conduction and nanoscale potential fluctuations in single crystals of archetypal topological insulator Bi_{2}Se_{3}. Here it is established that the defect concentrations in Bi_{2}Se_{3} are far above the thermodynamic limit, and that the growth kinetics dominate the observed defect concen… Show more

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Cited by 76 publications
(94 citation statements)
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“…As-grown Bi 2 Se 3 is usually electron-doped due to naturally formed Se vacancies [48]. In this study, we use well-characterized samples with low concentration of impurities and crystalline defects [49]. All the bulk phonon modes in this crystal are sharp with no signatures of any impurity modes, and all the surface phonon modes are clearly observed [50].…”
mentioning
confidence: 99%
“…As-grown Bi 2 Se 3 is usually electron-doped due to naturally formed Se vacancies [48]. In this study, we use well-characterized samples with low concentration of impurities and crystalline defects [49]. All the bulk phonon modes in this crystal are sharp with no signatures of any impurity modes, and all the surface phonon modes are clearly observed [50].…”
mentioning
confidence: 99%
“…For Bi 2 Se 3 , the most common defect is Se deficiency. [9] However, the EDX elemental mapping shows that Se and Bi are uniformly distributed within the detection limit of ≈0.5 wt% ( Figure S6, Supporting Information). Even in nano-Auger element mapping ( Figure S7, Supporting Information) with a lower detection limit (≈0.1 at%) and a higher lateral resolution (≈10 nm), the distribution of Se also appears to be uniform.…”
Section: Wwwadvelectronicmatdementioning
confidence: 99%
“…[9,19] However, these previous studies only focus on the identification of defects at the atomic level, without probing the distribution of these defects at the mesoscopic scale, and the associated influence on the electronic structures and optical properties. Herein, our IR s-SNOM images reveal that these defect-rich regions, with higher carrier concentrations, can form mesoscale optical contrast with high symmetry, and these optical responses can be understood and simulated by a simple theoretical model (Figure 2h).…”
Section: Wwwadvelectronicmatdementioning
confidence: 99%
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