Towards an integrated materials characterization toolbox

Abstract

Abstract

Image processing for materials characterization: Issues, challenges and opportunities

“…Although not its main application, image processing is progressively taking part in this challenge [8]. Moreover, with the increasing precision of instrumentation, down to the direct observation of atomic processes at the sub-Ångström scale, evolving over picoseconds [9], the data flow is likely to require a tremendous effort from the image processing community, involving various topics from compression [10] to restoration [11], to the standardization of processing work-flows on different image channels or modalities [12]. This possibility is backed in [13]:…”

Microstructural Characterization of Hard Ceramics

“…(Robertson et al, 2011) Because this contrast mechanism is sensitive to variations in the atomic number, it creates clear phase contrast. However, electron tomography can also be carried out with bright field or dark field images, although competing contrast mechanisms can interfere with the three--dimensional reconstruction.…”

“…In addition to structural information in multiphased materials, electron tomography has also been used to study dislocation dynamics and magnetic domain structure. (Robertson et al, 2011) The resolution of this technique is on the order of 1 nm.…”

“…Furthermore, recent advances in the ability to focus X--rays has made it possible to increase the resolution of synchrotron tomography to approximately 20 nm. (Robertson et al, 2011) An example of X--ray tomography is shown in Fig. 15.…”

“…(Robertson et al, 2011) At the atomic scale, there have been significant advances in field ion microscopy. Although this technique has been available for decades, the limited volume of material that could be imaged and the types of materials that could be imaged made it impractical for many studies.…”