Modern scanning tunneling microscopes (STMs) are often employed in the imaging of crystalline surfaces at atomic resolution, Fig. 1. In recent years, we adapted crystallographic image processing (CIP) techniques that originated in the field of electron crystallography some 50 years ago to the imaging with scanning probe microscopes [1][2][3]. In cases of images from STMs and atomic force microscopes, our CIP method allows for the removal of the effects of a blunt scanning probe tip [2,3].Recent improvements to our method allow for fully objective, i.e. completely researcher independent, classifications of noisy 2D periodic images into Bravais lattice types [3,4], Laue classes [4], and plane symmetry groups [4]. The preconditions that need to be fulfilled for the application of our new information theory based method are a sufficiently long-range ordered crystalline material, a sufficient number of repeats of the unit cell in the image, and a relatively modest amount of generalized Gaussian noise [4,5]. Because discrete Fourier transforms are involved, noise in the images reduces to "noise per unit cell" with the square root of the number of unit cells that are processed [4]. Generalized noise arises from multiple sources in all imaging and image processing steps as well as from structural defects in the crystalline sample itself. None of these sources is allowed to dominate so that the central limit theorem applies and the sum total of all errors possesses approximately a Gaussian distribution [4,5]. The type of the microscope is not important; it is only important that its operation is reasonably stable and uncorrected systematic errors are small compared to the sum total of generalized random errors.We applied our method to a STM image from a graphite sample that is openly available (in the on-line supporting material of [6]), Fig. 1. Utilizing sets of ratios of geometric-bias corrected squared residuals for the involved symmetry hierarchy branches, see right hand side of Fig. 1, the plane symmetry group of the selected region of the STM image was determined to be h31m with confidence levels of approximately 26 % over c11m (on the basis of the primitive sub-units of oc lattices [8] averaged over three settings) as well as 95 % over h3, respectively. There are, thus, no serious doubts that the prevailing translation symmetry of the STM-imaged graphite sample is that of the 2D hexagonal Bravais lattice type (as also obtained in [6]). Note in passing that the h31m result is indicative of a rhombohedral layer stacking that may be due to the sample preparation. Note also that h31m on a triple hexagonal unit cell features the same plane symmetries as p3m1 on a three times smaller cell [5], since the former is a minimal non-isomorphic supergroup of index 3 of the latter. Our classification enabling geometric-bias corrected residuals are in the form of geometric Akaike information criteria [9] as derived in [4]. Our confidence levels are based on the information content equation in [9] as derived in [3] and recently ge...