2021 24th Euromicro Conference on Digital System Design (DSD) 2021
DOI: 10.1109/dsd53832.2021.00034
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Towards Machine Learning Support for Embedded System Tests

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Cited by 2 publications
(1 citation statement)
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“…Despite of the rapid development of real-time testing platforms, research on developing an intelligent system able to detect, isolate and identify faults during the development process is still in the early stages. For example, as an improvement of the embedded system testing process, Scharoba et al [39] have proposed a proximity-based anomaly detection system using ML techniques to automatically evaluate the test runs and identify the faulty behaviour. The method has been developed based on the historical test records so that deviations from the normal behaviour of the test object can be detected.…”
Section: A Fault Detection and Diagnosis In Automotive Domainmentioning
confidence: 99%
“…Despite of the rapid development of real-time testing platforms, research on developing an intelligent system able to detect, isolate and identify faults during the development process is still in the early stages. For example, as an improvement of the embedded system testing process, Scharoba et al [39] have proposed a proximity-based anomaly detection system using ML techniques to automatically evaluate the test runs and identify the faulty behaviour. The method has been developed based on the historical test records so that deviations from the normal behaviour of the test object can be detected.…”
Section: A Fault Detection and Diagnosis In Automotive Domainmentioning
confidence: 99%