2016
DOI: 10.1016/j.mechatronics.2016.05.016
|View full text |Cite
|
Sign up to set email alerts
|

Towards nanoreliability of sensors incorporating interfaces between single-walled carbon nanotubes and metals: molecular dynamics simulations and in situ experiments using electron microscopy

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

0
3
0

Year Published

2016
2016
2024
2024

Publication Types

Select...
3
1

Relationship

2
2

Authors

Journals

citations
Cited by 4 publications
(3 citation statements)
references
References 59 publications
0
3
0
Order By: Relevance
“…Still, large amounts of characterization and testing are required to characterize for device reliability. Such reliability tests can be achieved by the SCA, as, e.g., promoted by Meszmer et al Together with nanocharacterization, this gives insights into the nanoscopic failure mechanisms for CNT metal contacts …”
Section: Discussionmentioning
confidence: 97%
See 1 more Smart Citation
“…Still, large amounts of characterization and testing are required to characterize for device reliability. Such reliability tests can be achieved by the SCA, as, e.g., promoted by Meszmer et al Together with nanocharacterization, this gives insights into the nanoscopic failure mechanisms for CNT metal contacts …”
Section: Discussionmentioning
confidence: 97%
“…These range from gravity and weight‐utilizing bending devices, over membrane‐based pressure sensors with various forms of actuation, to cantilever structures being actuated by an AFM tip . Such cantilever actuation can be used to determine the maximum pull‐out force of CNTs from the metal contact for microscopic devices …”
Section: Cnt Strain Sensor Technologymentioning
confidence: 99%
“…In the present article, we will highlight the developments in nanocharacterization for CNT and CNT‐based devices for 1) CNT‐based vertical interconnects, or vias (vertically aligned CNTs acting as nanostructured conductor); 2) CNT‐based field‐effect transistors (CNTFETs) with CNTs as planar semiconducting transistor channel; and 3) monolithic microelectromechanical systems (MEMS) with mechanical interfaces to integrate CNTs and other nanomaterials in hybrid NEMS. The latter can even act as an entirely new class of test platforms for the micro–nano interface …”
Section: Introductionmentioning
confidence: 99%