Towards Prognostics of Electrolytic Capacitors

Celaya, José R.; Kulkarni, Chetan S.; Biswas, Gautam; Goebel, Kai

doi:10.2514/6.2011-1519

Cited by 22 publications

(23 citation statements)

References 12 publications

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“…An empirical degradation model can be used to model the degradation process when a physics-based degradation model is not available. This methodology has been used for prognostics of electrolytic capacitors using a Kalman filter [12]. There, the exponential degradation model was posed as a linear firstorder discrete dynamic system in the form of a state-space model representing the dynamics of the degradation process.…”

Section: Degradation Modelingmentioning

confidence: 99%

Prognostics approach for power MOSFET under thermal-stress aging

Celaya

Saxena

Kulkarni

et al. 2012

2012 Proceedings Annual Reliability and Maintainability Symposium

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The prognostic technique for a power MOSFET presented in this paper is based on accelerated aging of MOSFET IRF520Npbf in a TO-220 package. The methodology utilizes thermal and power cycling to accelerate the life of the devices. The major failure mechanism for the stress conditions is dieattachment degradation, typical for discrete devices with leadfree solder die attachment. It has been determined that dieattach degradation results in an increase in ON-state resistance due to its dependence on junction temperature. Increasing resistance, thus, can be used as a precursor of failure for the die-attach failure mechanism under thermal stress. A feature based on normalized ON-resistance is computed from in-situ measurements of the electro-thermal response. An Extended Kalman filter is used as a model-based prognostics techniques based on the Bayesian tracking framework.The proposed prognostics technique reports on preliminary work that serves as a case study on the prediction of remaining life of power MOSFETs and builds upon the work presented in [1]. The algorithm considered in this study had been used as prognostics algorithm in different applications and is regarded as suitable candidate for component level prognostics. This work attempts to further the validation of such algorithm by presenting it with real degradation data including measurements from real sensors, which include all the complications (noise, bias, etc.) that are regularly not captured on simulated degradation data.The algorithm is developed and tested on the accelerated aging test timescale. In real world operation, the timescale of the degradation process and therefore the RUL predictions will be considerable larger. It is hypothesized that even though the timescale will be larger, it remains constant through the degradation process and the algorithm and model would still apply under the slower degradation process. By using accelerated aging data with actual device measurements and real sensors (no simulated behavior), we are attempting to assess how such algorithm behaves under realistic conditions.

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Section: Degradation Modelingmentioning

confidence: 99%

Prognostics approach for power MOSFET under thermal-stress aging

Celaya

Saxena

Kulkarni

et al. 2012

2012 Proceedings Annual Reliability and Maintainability Symposium

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“…This has implications in the development of degradation models for prognostics. The degradation model presented in [4,6] and later is Section 3.1, does not include this behavior and should be updated in future work. The self-recovery behavior is believed to represent very slow internal dynamics that do not reach steady state at the time of the characterization of devices, which happens right after the EOS is applied for a long period.…”

Section: Electrical Overstress Accelerated Aging (Eos)mentioning

confidence: 99%

“…In this aging experiment we emulated conditions similar to high temperature storage, where capacitors are placed in a controlled chamber and the temperature is raised above their rated specification [4,7]. The chamber temperature was gradually increased in steps of 25°C until the pre-determined temperature limit was reached.…”

Section: Thermal Overstress Accelerated Agingmentioning

confidence: 99%

“…The behavior presented in Figure 4 corresponds to the first segment of aging in Figure 2. This model, originally introduced in [4,6], relates aging time to the percentage loss in capacitance and has the following form,…”

Section: Empirical Degradation Model Under Electrical Overstressmentioning

confidence: 99%

“…The tests are conducted at room temperature. For further details regarding the aging experiment set up refer to [3,4].…”

Section: Electrical Overstress Accelerated Aging (Eos)mentioning

confidence: 99%

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Accelerated aging in electrolytic capacitors for prognostics

Celaya

Kulkarni

Saha

et al. 2012

2012 Proceedings Annual Reliability and Maintainability Symposium

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SUMMARY AND CONCLUSIONSThe focus of this work is the analysis of different degradation phenomena based on thermal overstress and electrical overstress accelerated aging systems and the use of accelerated aging techniques for prognostics algorithm development. Results on thermal overstress and electrical overstress experiments are presented. In addition, preliminary results toward the development of physics-based degradation models are presented focusing on the electrolyte evaporation failure mechanism. An empirical degradation model based on percentage capacitance loss under electrical overstress is presented and used in: (i) a Bayesian-based implementation of model-based prognostics using a discrete Kalman filter for health state estimation, and (ii) a dynamic system representation of the degradation model for forecasting and remaining useful life (RUL) estimation. A leave-one-out validation methodology is used to assess the validity of the methodology under the small sample size constrain.The results observed on the RUL estimation are consistent through the validation tests comparing relative accuracy and prediction error. It has been observed that the inaccuracy of the model to represent the change in degradation behavior observed at the end of the test data is consistent throughout the validation tests, indicating the need of a more detailed degradation model or the use of an algorithm that could estimate model parameters on-line. Based on the observed degradation process under different stress intensity with rest periods, the need for more sophisticated degradation models is further supported. The current degradation model does not represent the capacitance recovery over rest periods following an accelerated aging stress period.

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Electronics Prognostics

Kulkarni¹,

Celaya²

2019

Fault Diagnosis of Dynamic Systems

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Towards Prognostics of Electrolytic Capacitors

Cited by 22 publications

References 12 publications

Prognostics approach for power MOSFET under thermal-stress aging

Prognostics approach for power MOSFET under thermal-stress aging

Accelerated aging in electrolytic capacitors for prognostics

Electronics Prognostics

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