2022 IEEE International Reliability Physics Symposium (IRPS) 2022
DOI: 10.1109/irps48227.2022.9764579
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Towards the Characterization of Full ID-VG Degradation in Transistors for Future Analog Applications

Pengpeng Ren
1
,
Xinfa Zhang
2
,
Junhua Liu
3
et al.
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