Trace Elemental Analysis of Metals by Laser Ablation Inductively Coupled Plasma Time-of-Flight Mass Spectrometry

Abstract

Inductively coupled plasma mass spectrometry (ICP‐MS) has become the technique of choice for trace elemental analysis recently. Much work has focused on direct solid‐sample introduction techniques for ICP‐MS, with laser ablation (LA) showing the most promise. Photographs taken of the LA craters are used to demonstrate independent optimization of the ablation event. The type of optimization used will depend on the individual analysis requirements. An axial time‐of‐flight (TOF) mass spectrometer is used in conjunction with the ICP for the direct analysis of metals. Using this combination, inhomogeneities of specific trace metals (Nd, Zr, and Ta) in certified standard reference materials were found, while other metals remained homogeneous. These results are confirmed using steady‐state scanning of the sample and individual spot analysis.

Axial inductively coupled plasma time-of-flight mass spectrometry using direct liquid sample introduction

“…Recently, an axial ICP-TOFMS instrument was explored using laser ablation 32,33 and conventional nebulizer-spray chamber arrangements [34][35][36][37][38][39][40] in terms of analytical performance and precision for isotope ratio measurements and speciation analysis. [33][34][35][36][37][38][39][40][41] In addition, figures of merit for an ICP-TOFMS based on an orthogonal arrangement were recently reported.…”

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“…So far, most of the work with glow discharge-mass spectrometry has been done by using doublefocusing spectrometers [8][9][10] or quadrupole systems. [11][12][13] In recent years, the use of time of flight (TOF) mass spectrometers in atomic spectrometry has been increasing [14][15][16] and this applies especially to glow discharge ion sources. [17][18][19][20] When compared with the commonly used scan-based mass detectors (such as quadrupole or double focussing systems), the TOFMS detector concept is simpler: a packet of ions given the same kinetic energy fly through a field-free tube and arrive at an ion detector in order of their mass-to-charge (m/z) values.…”

Emergence and impact of alternative sources and mass analyzers in plasma source mass spectrometry

“…[60][61][62][63] The on-axis design is currently marketed (albeit not aggressively) by LECO of St. Joseph, Michigan. 64 As the foregoing discussion indicates, plasma source-TOFMS is an extremely powerful 65 combination and is currently in use by many research groups throughout the world. Its main benefits, not surprisingly, arise when it is coupled to a transient sampling technique, such as laser ablation, 60,66 electrothermal vaporization, 63 flow-injection, 67,68 or chromatography.…”