2007 46th IEEE Conference on Decision and Control 2007
DOI: 10.1109/cdc.2007.4434192
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Tracking a nanosize magnetic particle using a magnetic force microscope

Abstract: A scheme for tracking nano-sized magnetic particles using a magnetic force microscope (MFM) is introduced. The stray magnetic field of the particle induces a shift in the phase of the oscillation of the MFM tip. The magnitude of this shift depends on the distance between the tip and the particle and can be expressed as a spatial field. We present a control law which steers the tip to a level set of this field. The approach is based on the previous work of two of the authors on a novel method for mapping unknow… Show more

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Cited by 4 publications
(3 citation statements)
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“…The sensitivity of this response is maximized when the tip is driven near its original natural frequency ω = ω 0 . From (2), this corresponds to φ = π 2 . Then, setting ω = ω 0 in (4) gives:…”
Section: A Force To Phase Modelmentioning
confidence: 93%
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“…The sensitivity of this response is maximized when the tip is driven near its original natural frequency ω = ω 0 . From (2), this corresponds to φ = π 2 . Then, setting ω = ω 0 in (4) gives:…”
Section: A Force To Phase Modelmentioning
confidence: 93%
“…We note that in previous work [2], we used a similar approach to develop a control law to track a given level set ∆Φ = const near the extremum. That law required knowledge of model parameters that in general are difficult to determine.…”
Section: A Tracking In the Planementioning
confidence: 98%
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