“…5(b,c), also reveals the presence of two carbon species in agreement with previous reports. 40 Although XPS involves ionizing radiation, the incident intensity in a laboratory source (Al Kα, used herein) is one or two orders of magnitude lower than the synchrotron radiation used for XE and XA, so radiation-induced degradation should be minimized (although, as previously noted, we believe radiation-induced degradation is minimal in our synchrotron XE and XA measurements of pristine MAPbI 3 ). If, for example, the defects are more concentrated near the surface, such as the first 30 nm of our ∼ 300 nm-thick MAPbI 3 film contains a defect concentration of 50% of the MA sites, then owing to the different probe attenuation lengths ( 1 nm for XPS, 200 nm for XE and XA, and several mm for NMR), we would expect to see 50% of the carbon 1s XPS, 15% of the carbon XA and XE, and 5% of the CH 3 NMR spectral intensities should be due to the defects, in reasonable agreement with the data shown in Fig.…”