Transconductance calibration of n-XYTER 1.0 readout ASIC

Sorokin, I.; Balog, T.; Krylov, V.; Schmidt, C.

doi:10.1016/j.nima.2013.02.013

Cited by 5 publications

(3 citation statements)

References 3 publications

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“…For a silicon sensor of thickness equivalent to 300 µm the MIP will deposit ≈ 22400 electrons in the bulk medium. From a detailed calibration of the n-XYTER prototype front-end ASIC it has been derived that the 22400 electrons is equivalent to (176 ± 6) ADC [12]. Figure 4, describes the schematic of the set-up for the laser induced charge generation of the e-h pairs in the bulk silicon for detector characterization.…”

Section: Non-invasive Characterizationmentioning

confidence: 99%

Non-invasive characterization and quality assurance of silicon micro-strip detectors using pulsed infrared laser

Ghosh

2016

J. Inst.

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A: The Compressed Baryonic Matter (CBM) experiment at FAIR is composed of 8 tracking stations consisting of roughly 1300 double sided silicon micro-strip detectors of 3 different dimensions. For the quality assurance of prototype micro-strip detectors a non-invasive detector charaterization is developed. The test system is using a pulsed infrared laser for charge injection and characterization, called Laser Test System (LTS). The system is aimed to develop a set of characterization procedures which are non-invasive (non-destructive) in nature and could be used for quality assurances of several silicon micro-strip detectors in an efficient, reliable and reproducible way. The procedures developed (as reported here) uses the LTS to scan sensors with a pulsed infra-red laser driven by step motor to determine the charge sharing in-between strips and to measure qualitative uniformity of the sensor response over the whole active area. The prototype detector modules which are tested with the LTS so far have 1024 strips with a pitch of 58 µm on each side. They are read-out using a self-triggering prototype read-out electronic ASIC called n-XYTER. The LTS is designed to measure sensor response in an automatized procedure at several thousand positions across the sensor with focused infra-red laser light (spot size ≈ 12 µm, wavelength = 1060 nm). The pulse with a duration of ≈ 10 ns and power ≈ 5 mW of the laser pulse is selected such, that the absorption of the laser light in the 300 µm thick silicon sensor produces ≈ 24000 electrons, which is similar to the charge created by minimum ionizing particles (MIP) in these sensors. The laser scans different prototype sensors and various non-invasive techniques to determine characteristics of the detector modules for the quality assurance is reported. K: Interaction of radiation with matter; Radiation-hard detectors; Detection of defects; Charge induction

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Section: Non-invasive Characterizationmentioning

confidence: 99%

Non-invasive characterization and quality assurance of silicon micro-strip detectors using pulsed infrared laser

Ghosh

2016

J. Inst.

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“…The tests aimed at characterizing the signal transmission from the sensors through the cable bridge to the read-out electronics. The electronics employed was based on the n-XYTER ASIC, a self-triggering chip stemming from a different project that found use in testing early prototypes of several CBM detector systems with well known performance specifications [9]. One of the modules tested is shown in Fig.…”

Section: Test Of Prototype Modulesmentioning

confidence: 99%

The Silicon Tracking System of the CBM Experiment at FAIR

Heuser

2015

Proceedings of the 2nd International Symposium on Science at J-Parc — Unlocking the Mysteries of Life, Matter and the Universe

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The Compressed Baryonic Matter (CBM) experiment at FAIR will conduct a systematic research program to explore the phase diagram of strongly interacting matter at highest net baryon densities and moderate temperatures. These conditions are to be created in collisions of heavy-ion beams with nuclear targets in the projectile beam energy range of 2 to 45 GeV/nucleon, initially coming from the SIS 100 synchrotron (up to 14 GeV/nucleon) and in a next step from SIS 300 enabling studies at the highest net baryon densities. Collision rates up to 10 7 per second are required to produce very rare probes with unprecedented statistics in this energy range. Their signatures are complex. These conditions call for detector systems designed to meet the extreme requirements in terms of rate capability, momentum and spatial resolution, and a novel data acquisition and trigger concept which is not limited by latency but by throughput. In the paper we describe the concept and development status of CBM's central detector, the Silicon Tracking System (STS). The detector realizes a large, highly granular and redundant detector system with fast read-out, and lays specific emphasis on low material budget in its physics aperture to achieve for charged particle tracks a momentum resolution of δp/p≈1% at p > 1 GeV/c, at >95% track reconstruction efficiency. The detector employs 1220 highly segmented double-sided silicon micro-strip sensors of 300 µm thickness, mounted into 896 modular structures of various types that are aggregated on 106 low-mass carbon fiber ladders of different sizes that build up the tracking stations. The read-out electronics with its supply and cooling infrastructure is arranged at the periphery of the ladders, and provides a total channel count of 1.8 million. The signal transmission from the silicon sensors to the electronics is realized through ultra-thin multi-line aluminum-polyimide cables of up to half a meter length. The electronics generates a free-streaming data flow of digitized time-stamped detector information that is sent via data aggregation boards to the first-level event selector, a computing farm for on-line event reconstruction. The power dissipated by the detector's read-out electronics, amounting to about 2 times 20 kW in two layers at the top and bottom of the detector, will be removed by a particularly efficient and space-saving bi-phase CO 2 cooling. The system integration of the detector takes respect of operating the sensors in a thermal enclosure at -5 • C, to limit leakage currents originating from radiation damage, and allows for maintenance to the detector components, in particular the sensors, if they should exceed an exposure to more than 10 14 1 MeV n eq /cm 2 . The detector system is developed and built by a CBM project team comprising institutes from Germany, Russia, Poland and Ukraine.

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“…The thickness of the silicon sensor are 300 µm thick and the 1 MIP will deposit ≈ 22.4 kilo electrons. From a detailed calibration of the n-XYTER prototype front-end ASIC it has been derived that the 22.4 kilo electrons is equivalent to 176 ± 6 ADC [11] .…”

Section: Infra-red Laser Characterizationmentioning

confidence: 99%

Characterization of silicon micro-strip sensors with a pulsed infra-red laser system for the CBM experiment at FAIR

Ghosh

2015

J. Inst.

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The Compressed Baryonic Matter (CBM) experiment at FAIR is composed of 8 tracking stations consisting of 1292 double sided silicon micro-strip sensors. For the quality assurance of produced prototype sensors a laser test system (LTS) has been developed. The aim of the LTS is to scan sensors with a pulsed infra-red laser driven by step motor to determine the charge sharing in-between strips and to measure qualitative uniformity of the sensor response over the whole active area. The prototype sensors which are tested with the LTS so far have 256 strips with a pitch of 50 μm on each side. They are read-out using a self-triggering prototype read-out electronic ASIC called n-XYTER. The LTS is designed to measure sensor response in an automatized procedure at several thousand positions across the sensor with focused infra-red laser light (spot size ≈ 12 μm , wavelength = 1060 nm). The pulse with duration (≈ 10 ns) and power (≈ 5 mW) of the laser pulses is selected such, that the absorption of the laser light in the 300 μm thick silicon sensors produces a number of about 24000 electrons, which is similar to the charge created by minimum ionizing particles (MIP) in these sensors. Laser scans different prototype sensors is reported.

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Transconductance calibration of n-XYTER 1.0 readout ASIC

Cited by 5 publications

References 3 publications

Non-invasive characterization and quality assurance of silicon micro-strip detectors using pulsed infrared laser

Non-invasive characterization and quality assurance of silicon micro-strip detectors using pulsed infrared laser

The Silicon Tracking System of the CBM Experiment at FAIR

Characterization of silicon micro-strip sensors with a pulsed infra-red laser system for the CBM experiment at FAIR

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