Transformer-based low frequency noise measurement system for the investigation of infrared detectors’ noise

Achtenberg, Krzysztof; Mikołajczyk, J.; Ciofi, C.; Scandurra, G.; Bielecki, Z.

doi:10.1016/j.measurement.2021.110657

Cited by 5 publications

(9 citation statements)

References 28 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The resistances Rba and Rbb are typically chosen much higher than RD, so their noise contribution and loading effect can be neglected. With the further assumption of a negligible contribution from the EICN of the voltage amplifier VA, the PSD of the voltage noise SVO at the output of the system can be written as [19]: With the switch S W in position one, Figure 2 represents the most common lowfrequency noise measurement configuration on biased electron devices [25]. In this configuration, the bridge arrangement made of R ba , R bb , R V , and R D is required to bias the DUT with a constant current while avoiding that a DC current flows through the primary winding of the transformer.…”

Section: Proposed Approachmentioning

confidence: 99%

Section: Proposed Approachmentioning

confidence: 99%

“…Since the noise generated by the secondary winding is divided by n 2 in Equation ( 2), the main contribution to the background noise of a transformercoupled amplifier can be reduced to the noise introduced by the primary winding and by the resistance R V . In a recent paper [19], it has been demonstrated that by applying the cross-correlation approach to a pair of nominally identical transformer-coupled amplifiers, the contribution to the BN by the transformer winding resistances can be greatly reduced so that the main contribution to the background noise remains the one introduced by the resistance R V . Note that R V also contributes to an increase of the cut-in frequency f P1 .…”

Section: Proposed Approachmentioning

confidence: 99%

“…For frequencies above the series resonance frequency f P2 , Equation (4) assumes a form very close to the ideal expression in Equation ( 2), save that we have the additional noise coming from the windings of the transformer. As we have noted before, however, the contribution from the secondary winding can be often neglected and, provided we resort to a cross-correlation arrangement as in [19], extremely low levels of BN can be obtained that are not bounded, as in the case of the bridge approach, by the noise generated by the resistance R V .…”

Section: Proposed Approachmentioning

confidence: 99%

“…This is the typical situation when noise measurements are employed to characterize the quality and reliability of electron devices with a low equivalent impedance [16][17][18]. In [19], the possibility of combining the cross-correlation approach and the use of signal transformers has been explored for the accurate investigation of advanced infrared detector (IR) devices, characterized by a very low equivalent resistance (in the Electronics 2022, 11, 2011 2 of 10 order of a few ohms). Because of transformers connected to the DUT, a bridge arrangement had to be used to bias the DUT with a constant current while avoiding that a DC current flowed through the transformers' primary winding.…”

Section: Introductionmentioning

confidence: 99%

See 4 more Smart Citations

On the Use of Supercapacitors for DC Blocking in Transformer-Coupled Voltage Amplifiers for Low-Frequency Noise Measurements

et al. 2022

Self Cite

View full text Add to dashboard Cite

When performing low-frequency noise measurements on low-impedance electron devices, transformer coupling can be quite effective in reducing the contribution of the equivalent input noise voltage of the preamplifier to the background noise of the system. However, noise measurements on electron devices are usually performed with a biased device under test. A bridge configuration must be used to null the DC component at the input of the transformer. Unfortunately, using a bridge results in a complication of the set-up and degradation of the system’s sensitivity because of the noise introduced by the nulling arm. We propose an alternative approach for blocking the DC component that exploits the fact that supercapacitors with capacitances in excess of a few Farads are nowadays easily available. Actual measurement results in conventional and advanced measurement configurations are discussed that demonstrate the advantages of the approach we propose.

show abstract

Section: Proposed Approachmentioning

confidence: 99%

Section: Proposed Approachmentioning

confidence: 99%

Section: Proposed Approachmentioning

confidence: 99%

Section: Proposed Approachmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 3 more Smart Citations

On the Use of Supercapacitors for DC Blocking in Transformer-Coupled Voltage Amplifiers for Low-Frequency Noise Measurements

et al. 2022

Self Cite

View full text Add to dashboard Cite

show abstract

A near‐DC measurement and modelling of low‐frequency noise in electronic components

Shamaee,

Mivehchy,

Kazemi

2023

IET Science Measure & Tech

View full text Add to dashboard Cite

Low‐frequency noise, generated inherently by the number or mobility fluctuation of carriers, is a crucial concern for the design of analog and digital circuits. Unified modelling based on experimental validation of near‐DC noise in amplifiers is a long‐standing open problem. This article develops a model for low‐frequency noise by deriving new bounds for carrier capturing and releasing. According to the proposed model, a measurement system is suggested that operates in a wide frequency range and even at very low frequencies. The system is noise‐tolerant, since the amplifier is selected based on acceptable noise levels. Among the advantages are the independence from specialized structural noise models for each component and the low cost of the measurement system. The evaluation results show that the proposed method leads to a promising improvement in the low‐frequency noise measuring and is superior to conventional models in the normalized root mean square error indicator. Findings reveal that the proposed measurement method can estimate the flicker noise around the DC frequency, and the proposed model agrees reasonably with the proposed measurement circuit.

show abstract

A review of design approaches for the implementation of low-frequency noise measurement systems

Scandurra

Ciofi

Smulko

et al. 2022

Review of Scientific Instruments

View full text Add to dashboard Cite

Electronic noise has its roots in the fundamental physical interactions between matter and charged particles, carrying information about the phenomena that occur at the microscopic level. Therefore, Low-Frequency Noise Measurements (LFNM) are a well-established technique for the characterization of electron devices and materials and, compared to other techniques, they offer the advantage of being non-destructive and of providing a more detailed view of what happens in the matter during the manifestation of physical or chemical phenomena. For this reason, LFNM acquire particular importance in the modern technological era in which the introduction of new advanced materials requires in-depth and thorough characterization of the conduction phenomena. LFNM also find application in the field of sensors, as they allow to obtain more selective sensing systems even starting from conventional sensors. Performing meaningful noise measurements, however, requires that the background noise introduced by the measurement chain be much smaller than the noise to be detected and the instrumentation available on the market does not always meet the specifications required for reaching the ultimate sensitivity. Researchers willing to perform LFNM must often resort to the design of dedicated instrumentation in their own laboratories, but their cultural background does not necessarily include the ability to design, build, and test dedicated low noise instrumentation. In this review, we have tried to provide as much theoretical and practical guidelines as possible, so that even researchers with a limited background in electronic engineering can find useful information in developing or customizing low noise instrumentation.

show abstract

Transformer-based low frequency noise measurement system for the investigation of infrared detectors’ noise

Cited by 5 publications

References 28 publications

On the Use of Supercapacitors for DC Blocking in Transformer-Coupled Voltage Amplifiers for Low-Frequency Noise Measurements

On the Use of Supercapacitors for DC Blocking in Transformer-Coupled Voltage Amplifiers for Low-Frequency Noise Measurements

A near‐DC measurement and modelling of low‐frequency noise in electronic components

A review of design approaches for the implementation of low-frequency noise measurement systems

Contact Info

Product

Resources

About