2006
DOI: 10.1111/j.1365-2818.2006.01554.x
|View full text |Cite
|
Sign up to set email alerts
|

Transient analysis of gaseous electron‐ion recombination in the environmental scanning electron microscope

Abstract: SummaryMost of the work carried out in relation to contrast mechanisms and signal formation in an environmental scanning electron microscope has yet to consider the time dependent aspects of image generation at a quantitative level. This paper quantitatively describes gaseous electron-ion recombination (also known as 'signal scavenging') in an environmental scanning electron microscope at a transient level by utilizing the dark shadows/streaks seen in gaseous secondary electron detector images of alumina (Al 2… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

1
12
0

Year Published

2006
2006
2018
2018

Publication Types

Select...
5

Relationship

1
4

Authors

Journals

citations
Cited by 6 publications
(13 citation statements)
references
References 45 publications
1
12
0
Order By: Relevance
“…Another question arises about the best choice of gas to be used in ESEM conditions (gaseous electron‐ion) which should be the most appropriate to work in low vacuum, partly because a better signal is obtained when working with low accelerating voltage, in order not to damage the biological sample, especially when observing thin layer cells and unicellular material (Morgan & Phillips, 2006; Danilatos, 2009).…”
Section: Introductionmentioning
confidence: 99%
“…Another question arises about the best choice of gas to be used in ESEM conditions (gaseous electron‐ion) which should be the most appropriate to work in low vacuum, partly because a better signal is obtained when working with low accelerating voltage, in order not to damage the biological sample, especially when observing thin layer cells and unicellular material (Morgan & Phillips, 2006; Danilatos, 2009).…”
Section: Introductionmentioning
confidence: 99%
“…Inelastic collisions between the cascading SEs and gas molecules are capable of producing ionization, which generates PIs and additional continuum electrons commonly referred to as environmental SEs ͑ESEs͒. 33,34,50,51 As a consequence of their low mobility and recombination lifetime compared to that of electrons, PIs are also capable of producing a positive ion space charge, which can impede E generated by V GSED , affecting cascade amplification and consequently, image contrast. 29,48 High energy PEs and backscattered electrons ͑BSEs͒ are also capable of ionizing collisions with gas molecules and subsequent cascade amplification of the ESEs produced.…”
Section: A Electronic Gas Cascade Amplificationmentioning
confidence: 99%
“…The SE signals are amplified and detected using a positively biased metallic ring ͑or wire͒ connected to an electronic amplifier that is placed above or near a grounded stage. 34 Image formation in a VPSEM can be achieved not only by detecting electron signals induced in grounded or biased electrodes, but also via the detection of ultraviolet ͑UV͒, visible ͑vis͒, and infrared ͑IR͒ photons generated in the gas through the excitation of atoms and/or molecules by free electrons, known as gaseous scintillation. Electron detection can be performed by extracting induced signals not only from the biased electrode itself but also from the stage or sample itself grounded through a specimen current amplifier, commonly referred to as specimen current, 1,20,26-28 ion current, 2,[29][30][31][32][33] or induced stage current ͑ISC͒ imaging.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…For the detection of SEs in the VPSEM, several new detectors have been developed since the first experiments with the gaseous environment surrounding specimens were published (Robinson, 1978). These detectors can be divided into two groups: (i) the detectors that take advantage of a cascade amplification of signal electrons in the gaseous environment in an electrostatic field at the electric field strength typically from tens to hundreds of V/mm (Danilatos, 1990; Fletcher et al ., 1999; Morgan & Phillips, 2006a; Thiel et al , 2006) and (ii) the scintillation detectors.…”
Section: Introductionmentioning
confidence: 99%