2013
DOI: 10.1109/ted.2013.2252903
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Transient Analysis of Partial Thermal Characteristics of Multistructure Power LEDs

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Cited by 22 publications
(9 citation statements)
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“…Hence, the TIM for the LED on FR4 underwent relatively lower thermal stress than that of the MCPCB. In addition, the large CTE mismatch resulted in delamination at the interface and a high concentration of thermal stress (Nishimura et al, 1989), which caused an increase in contact R th at the interface (Wang et al, 2013). This means that a negligible CTE between two surfaces has the potential for enhancing the reliability and thermal management of microelectronic devices (Permal et al, 2018).…”
Section: Resultsmentioning
confidence: 99%
“…Hence, the TIM for the LED on FR4 underwent relatively lower thermal stress than that of the MCPCB. In addition, the large CTE mismatch resulted in delamination at the interface and a high concentration of thermal stress (Nishimura et al, 1989), which caused an increase in contact R th at the interface (Wang et al, 2013). This means that a negligible CTE between two surfaces has the potential for enhancing the reliability and thermal management of microelectronic devices (Permal et al, 2018).…”
Section: Resultsmentioning
confidence: 99%
“…conversion efficiency of high-power LEDs is 20% and up to 80% of energy is released as heat [2]. The problem of heat dissipation restricts the development of high-power LEDs [3][4][5][6].…”
Section: Introductionmentioning
confidence: 99%
“…This type of LED has a vertical structure that offers efficient heat dissipation, current spreading, and longterm reliability [18]. The LED package thermal resistance results from the die-attached layer (65%), chip (20%), and heat slug (15%) [19].…”
Section: Introductionmentioning
confidence: 99%