Transient simulation of lossy multiconductor interconnects

Abstract

The transient simulation of electrically-long low-loss multiconductor interconnects is considered from a practical point of view. The importance of frequencydependent losses in these interconnects is discussed and a simple transmission line characterization procedure allowing for such losses is proposed. The characterization obtained yields simple and efficient interconnect models, that the user can include, without programming, in any simulator accepting differential operators.