Transient space-charge-limited currents including diffusion

Schilling, Ronald B.; Schachter, Harry

doi:10.1016/0038-1101(67)90098-6

“…As is usual for space charge calculations, we have omitted any diffusive spreading in the charge-driven cases. It has long been known that this is an acceptable approximation (Schilling and Schachter 1967). The effect of diffusion would be to soften the sharp boundary between the charged and the empty regions in our model, but it would not make any great difference to the results given here.…”

Section: Discussionmentioning

confidence: 82%

Interpretation of atomic force microscope (AFM) signals from surface charge on insulators

Wintle

¹

1997

Meas. Sci. Technol.

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Charge stored on the surface of an insulator at the sub-micron length scale can be observed with an atomic force microscope (AFM). The dynamics of the charge spreading due to three mechanisms are calculated: (a) surface conduction; (b) surface charge spreading due to self-repulsion; and (c) bulk space charge motion, which is necessarily coupled to a surface charge. Self-similar motion occurs in all three cases. The AFM signals decay with time, and the shapes of the decay curves are similar. We show that the surface-charge-perturbed cases can be identified because the time constant depends on the magnitude of the initial charge, but that separating the pure surface spreading from the bulk process may prove difficult.

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“…It has long been known that this is an acceptable approximation (Schilling and Schachter 1967). The effect of diffusion would be to soften the sharp boundary between the charged and the empty regions in our model, but it would not make any great difference to the results given here.…”

Section: Discussionmentioning

confidence: 82%

S-DUALITY AND SHAPE THEORY

Bauer¹

1979

Russ. Math. Surv.

0

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Charge stored on the surface of an insulator at the sub-micron length scale can be observed with an atomic force microscope (AFM). The dynamics of the charge spreading due to three mechanisms are calculated: (a) surface conduction; (b) surface charge spreading due to self-repulsion; and (c) bulk space charge motion, which is necessarily coupled to a surface charge. Self-similar motion occurs in all three cases. The AFM signals decay with time, and the shapes of the decay curves are similar. We show that the surface-charge-perturbed cases can be identified because the time constant depends on the magnitude of the initial charge, but that separating the pure surface spreading from the bulk process may prove difficult. † Permanent address:

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“…5 b, curve 2). Taking into account the above results the problem under consideration can be represented in terms of the drift approximation at t > tmin if one supposes that the injection of carriers follows the lawj,(Eo) depicted by (31) and (29). Under these conditions the decay of total current in time in section 111, when the charge is trapped, will be described by similar expressions as given in [25],…”

Section: Analysis Of Transient Single-injection Current At Slow Trappmentioning

confidence: 99%

Influence of Carrier Diffusion on Transient One-Carrier Injection Current in an Insulator with Traps

Baginskii

¹

,

Kostsov

²

1996

Phys. Stat. Sol. (a)

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The main influence on the transient process is shown to be exerted by the initial trapped space charge entering the dielectric before the onset of injection by carrier diffusion. This charge leads to a sharp decrease of the transient current and to a superlinear dependence of its value on the applied voltage in comparison with the case without diffusion. Approximate analytical solutions for the initial charge distribution and the transient current behavior are derived. They correspond to the results of an exact (numerical) solution of the general problem. Criteria for the validity of the diffusionless approximation are found.

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Transient space-charge-limited currents including diffusion

Cited by 17 publications

References 2 publications

Interpretation of atomic force microscope (AFM) signals from surface charge on insulators

Interpretation of atomic force microscope (AFM) signals from surface charge on insulators

S-DUALITY AND SHAPE THEORY

Influence of Carrier Diffusion on Transient One-Carrier Injection Current in an Insulator with Traps

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