Abstract:Single Event Transients (SETs) have become a major reliability concern for integrated circuits used in critical applications. Research to improve the radiation robustness of digital circuits has been conducted, assessing all abstraction levels (from the device up to the system). This study evaluates transistor-level radiation-hardened techniques in combinational logic, such as transistor folding, sizing and reordering. In addition, the efficiency of using supergates, including series-parallel and non-series-pa… Show more
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