2018
DOI: 10.1021/acs.jpcc.8b00239
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Transition-Metal-Incorporated Aluminum Oxide Thin Films: Toward Electronic Structure Design in Amorphous Mixed-Metal Oxides

Abstract: Amorphous metal oxides have numerous applications spanning from electronics to catalysis. The ability to rationally design the electronic structure of such materials would thus have significant impact. Previous work has shown that the amorphous structure allows for uniformly incorporating a large number of different metal cations into ultrasmooth thin films. Here we investigate how the atomic structure, electronic structure, and optical absorption properties of amorphous aluminum oxide (a-Al 2 O 3 ) thin films… Show more

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Cited by 8 publications
(16 citation statements)
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“…This increase for mixed compositions may further arise from changes in coordination of Fe in the amorphous oxide. The coordination of Fe drops from 6 in Fe 2 O 3 to ∼4 in Al (1– x ) Fe x O y , and the Fe–O bond length shortens, suggesting more tetrahedral than octahedral Fe 3+ ions . Because methoxy and OH formation are maximum at Al6Fe4 and do not increase with further 4-fold coordinated Fe sites in Al4Fe6, this suggests both Al and Fe participate in methanol dissociation.…”
Section: Resultsmentioning
confidence: 99%
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“…This increase for mixed compositions may further arise from changes in coordination of Fe in the amorphous oxide. The coordination of Fe drops from 6 in Fe 2 O 3 to ∼4 in Al (1– x ) Fe x O y , and the Fe–O bond length shortens, suggesting more tetrahedral than octahedral Fe 3+ ions . Because methoxy and OH formation are maximum at Al6Fe4 and do not increase with further 4-fold coordinated Fe sites in Al4Fe6, this suggests both Al and Fe participate in methanol dissociation.…”
Section: Resultsmentioning
confidence: 99%
“…Different ratios of 0.2 M aqueous solutions (prepared in 18.2 MΩ cm water) of transition-metal nitrate salts (Fe­(NO 3 ) 3 and Mn­(NO 3 ) 2 ) were mixed with 0.2 M aq Al­(NO 3 ) x (OH) 3– x clusters, prepared by bulk electrolysis . The solution was spun coat onto a Si wafer, previously coated with Ti and Ir by electron-beam evaporation to mitigate potential electrostatic charging, and annealed at 450 °C for 30 min . The final film thickness was targeted to be 5 nm, and previous physical characterization of films prepared by the same technique illustrated near-atomic roughness (root-mean-squared roughness of ∼0.15 nm) by atomic force microscopy .…”
Section: Methodsmentioning
confidence: 99%
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“…There is a wealth of previous literature concerned with tackling just this problem. [69][70][71][72][73][74][75] Here we use the approach given by Emami et al 76 as they show excellent agreement between the experimental and the theoretical surface OH concentration. To facilitate the analysis of the results for oxygen incorporation energies and migration barriers we also employ a crystalline SiO 2 model to give context to the a-SiO 2 calculations.…”
Section: Sio 2 Surfacementioning
confidence: 99%