High-pressure freezeout of electrons onto metastable states of a Si donor, as well as the persistent photoconductivity method were used to tune the concentration of a two-dimensional electron gas nSDEG in a GaAsIAIGaAs heterostructure. This made the measurement of t h e temperature dependence of the ZOEG mobility possible in a wide range of nZDEG values, even though this was applied to only one sample. Consequently, it enabled the determination of various contributions to ZOEG mobility and in particular the separation of the acoustic phonon scattering from other scattering mechanisms. The above procedure leads to the determination of the deformation potential and points out its screening by free carriers. This screening is well described by the random phase approximation T h e resulting conduction band deformation potential was found to be 12.5 f 0.5 eV